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1. WO2010058329 - SYSTEM AND METHOD FOR X-RAY SCATTER CORRECTION

Publication Number WO/2010/058329
Publication Date 27.05.2010
International Application No. PCT/IB2009/055032
International Filing Date 12.11.2009
IPC
G06T 11/00 2006.01
GPHYSICS
06COMPUTING; CALCULATING OR COUNTING
TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
112D image generation
G06T 5/00 2006.01
GPHYSICS
06COMPUTING; CALCULATING OR COUNTING
TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
5Image enhancement or restoration
CPC
G06T 11/005
GPHYSICS
06COMPUTING; CALCULATING; COUNTING
TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
112D [Two Dimensional] image generation
003Reconstruction from projections, e.g. tomography
005Specific pre-processing for tomographic reconstruction, e.g. calibration, source positioning, rebinning, scatter correction, retrospective gating
G06T 2207/10116
GPHYSICS
06COMPUTING; CALCULATING; COUNTING
TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
2207Indexing scheme for image analysis or image enhancement
10Image acquisition modality
10116X-ray image
G06T 5/003
GPHYSICS
06COMPUTING; CALCULATING; COUNTING
TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
5Image enhancement or restoration
001Image restoration
003Deblurring; Sharpening
Applicants
  • PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH [DE]/[DE] (DE)
  • KONINKLIJKE PHILIPS ELECTRONICS N.V. [NL]/[NL] (AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BE, BF, BG, BH, BJ, BR, BW, BY, BZ, CA, CF, CG, CH, CI, CL, CM, CN, CO, CR, CU, CY, CZ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, FR, GA, GB, GD, GE, GH, GM, GN, GQ, GR, GT, GW, HN, HR, HU, ID, IE, IL, IN, IS, IT, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LV, LY, MA, MC, MD, ME, MG, MK, ML, MN, MR, MT, MW, MX, MY, MZ, NA, NE, NG, NI, NL, NO, NZ, OM, PE, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SI, SK, SL, SM, SN, ST, SV, SY, SZ, TD, TG, TJ, TM, TN, TR, TT, TZ, UA, UG, UZ, VC, VN, ZA, ZM, ZW)
  • WIESNER, Steffen, G. [DE]/[DE] (UsOnly)
  • BERTRAM, Matthias [DE]/[DE] (UsOnly)
  • WIEGERT, Jens [DE]/[DE] (UsOnly)
  • TIMMER, Jan [NL]/[NL] (UsOnly)
Inventors
  • WIESNER, Steffen, G.
  • BERTRAM, Matthias
  • WIEGERT, Jens
  • TIMMER, Jan
Agents
  • VAN VELZEN, Maaike
Priority Data
08169600.721.11.2008EP
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) SYSTEM AND METHOD FOR X-RAY SCATTER CORRECTION
(FR) SYSTÈME ET PROCÉDÉ DE CORRECTION DE LA DISPERSION DE RAYONS X
Abstract
(EN)
The invention relates to a method of scatter correction of a projection image acquired from an X-ray imaging system. The method is based on estimating an X-ray scatter distribution based on a weighted accumulation of the scatter contribution generated along individual source rays. The method incorporates two weighting functions to account for at least one of the two of a spatial non-uniformity of the X-ray radiation used in the X-ray imaging system and shading effects due to an anti-scatter-grid arranged in the X-ray imaging system.
(FR)
L'invention concerne un procédé de correction de dispersion d'une image de projection acquise à partir d'un système d'imagerie par rayons X. Le procédé repose sur l'estimation de la distribution de la dispersion des rayons X sur la base de l'accumulation pondérée de la contribution de dispersion générée le long des rayons sources individuels. Le procédé incorpore deux fonctions de pondération pour tenir compte d'au moins l'un des deux points entre la non-uniformité spatiale du rayonnement des rayons X utilisé dans le système d'imagerie par rayons X et les effets d’ombrage dus à une grille anti-dispersion disposée dans le système d'imagerie par rayons X.
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