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1. WO2010049175 - SAMPLE ANALYSIS SYSTEM

Publication Number WO/2010/049175
Publication Date 06.05.2010
International Application No. PCT/EP2009/007796
International Filing Date 30.10.2009
IPC
G01N 3/00 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
3Investigating strength properties of solid materials by application of mechanical stress
G01N 3/04 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
3Investigating strength properties of solid materials by application of mechanical stress
02Details
04Chucks
CPC
G01N 2203/0008
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2203Investigating strength properties of solid materials by application of mechanical stress
0001Type of application of the stress
0005Repeated or cyclic
0008High frequencies from 10 000 Hz
G01N 2203/0021
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2203Investigating strength properties of solid materials by application of mechanical stress
0014Type of force applied
0021Torsional
G01N 2203/0411
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2203Investigating strength properties of solid materials by application of mechanical stress
02Details not specific for a particular testing method
04Chucks, fixtures, jaws, holders or anvils
0411using pneumatic or hydraulic pressure
G01N 2203/0688
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2203Investigating strength properties of solid materials by application of mechanical stress
02Details not specific for a particular testing method
06Indicating or recording means; Sensing means
067Parameter measured for estimating the property
0688Time or frequency
G01N 3/04
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
3Investigating strength properties of solid materials by application of mechanical stress
02Details
04Chucks
G01N 3/32
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
3Investigating strength properties of solid materials by application of mechanical stress
32by applying repeated or pulsating forces
Applicants
  • MONTANUNIVERSITÄT LEOBEN [AT]/[AT] (AllExceptUS)
  • FRÖSCHL, Jürgen [AT]/[AT] (UsOnly)
  • EICHLSEDER, Wilfried [AT]/[AT] (UsOnly)
Inventors
  • FRÖSCHL, Jürgen
  • EICHLSEDER, Wilfried
Agents
  • DILG, Andreas
Priority Data
08019114.131.10.2008EP
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) SAMPLE ANALYSIS SYSTEM
(FR) SYSTÈME D'ANALYSE D'ÉCHANTILLONS
Abstract
(EN)
An apparatus for analyzing a sample, the apparatus comprising a first clamping chuck adapted for receiving a first portion of the sample, a second clamping chuck adapted for receiving a second portion of the sample, a first measurement unit adapted for measuring an oscillation, particularly a self-oscillation, of the sample and being coupled to the first clamping chuck, and a second measurement unit adapted for measuring the oscillation of the sample and being coupled to the second clamping chuck, wherein the first measurement unit is coupled to the first clamping chuck and the second measurement unit is coupled to the second clamping chuck so that measurement signals captured by the first measurement unit and by the second measurement unit are indicative of the oscillation along the sample.
(FR)
La présente invention concerne un appareil destiné à l'analyse d'un échantillon. Cet appareil comprend, d'une part un premier mandrin de serrage conçu pour recevoir une première partie de l'échantillon, ainsi qu'un second mandrin de serrage conçu pour recevoir une seconde partie de l'échantillon, d'autre part un premier module de mesure, qui est conçu pour mesurer une oscillation de l'échantillon, en particulier une oscillation interne spontanée, et qui est couplé au premier mandrin de serrage, et enfin un second module de mesure, qui est conçu pour mesurer l'oscillation de l'échantillon, et qui est couplé au second mandrin de serrage. En l'occurrence, le premier module de mesure est couplé au premier mandrin de serrage et le second module de mesure est couplé au second mandrin de serrage de façon que les signaux de mesure capturés par le premier module de mesure et le second module de mesure soient représentatifs de l'oscillation se produisant dans la longueur de l'échantillon.
Also published as
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