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1. (WO2010032806) ANALYSIS DEVICE
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2010/032806    International Application No.:    PCT/JP2009/066313
Publication Date: 25.03.2010 International Filing Date: 17.09.2009
G01N 35/08 (2006.01), G01N 1/00 (2006.01), G01N 15/00 (2006.01), G01N 33/49 (2006.01)
Applicants: ARKRAY, Inc. [JP/JP]; 57, Nishiaketa-cho, Higashikujo, Minami-ku, Kyoto-shi, Kyoto 6018045 (JP) (For All Designated States Except US).
FURUSATO Noriaki [JP/JP]; (JP) (For US Only).
HONDA Yasumasa [JP/JP]; (JP) (For US Only).
TAKAHASHI Daisuke [JP/JP]; (JP) (For US Only).
KOTAKI Minoru [JP/JP]; (JP) (For US Only).
HIRANO Yoshikazu [JP/JP]; (JP) (For US Only)
Inventors: FURUSATO Noriaki; (JP).
HONDA Yasumasa; (JP).
TAKAHASHI Daisuke; (JP).
KOTAKI Minoru; (JP).
HIRANO Yoshikazu; (JP)
Agent: YASHIMA Koji; 2nd Floor, Kyohan Building, 7, Kandanishiki-cho 2-chome, Chiyoda-ku, Tokyo 1010054 (JP)
Priority Data:
2008-237491 17.09.2008 JP
(JA) 分析装置
Abstract: front page image
(EN)Disclosed is an analysis device (1) provided with a resistor (2) for applying transfer resistance to a sample, and power sources (33, 54) for applying power to pass the sample through the resistor (2). The power sources (33, 54) comprise a pressurizing mechanism (33) that is disposed upstream of the resistor (2) and a decompressing mechanism (54) that is disposed downstream of the resistor (2). The pressurizing mechanism (33) and the decompressing mechanism (54) are tube pumps, for example. The resistor (2) is one that is provided with a plurality of microscopic flow paths, for example.
(FR)L'invention concerne un dispositif d'analyse (1), comprenant : une résistance (2) destinée à appliquer une résistance de transfert à un échantillon; et des sources de courant (33, 54) destinées à faire circuler un courant dans l'échantillon à travers la résistance (2). Les sources de courant (33, 54) comprennent un mécanisme de mise sous pression (33) placé en amont de la résistance (2) et un mécanisme de décompression (54) placé en aval de la résistance (2). Le mécanisme de mise sous pression (33) et le mécanisme de décompression (54) peuvent prendre la forme de pompes à tube. La résistance (2) peut être dotée d'une pluralité de chemins de passage microscopiques.
(JA) 本発明は、試料に移動抵抗を与えるための抵抗体2と、抵抗体2において試料を通過させるための動力を付与するための動力源33,54と、を備えた分析装置1に関する。動力源33,54は、抵抗体2よりも上流側に配置された加圧機構33と、抵抗2体よりも下流側に配置された減圧機構54と、を含んでいる。加圧機構33および減圧機構54は、たとえばチューブポンプである。抵抗体2は、たとえば複数の微細流路が設けられたものである。
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PE, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)