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1. WO2010032209 - COMPARATOR TESTING IN A FLASH A/D CONVERTER

Publication Number WO/2010/032209
Publication Date 25.03.2010
International Application No. PCT/IB2009/054084
International Filing Date 18.09.2009
IPC
H03M 1/10 2006.1
HELECTRICITY
03BASIC ELECTRONIC CIRCUITRY
MCODING, DECODING OR CODE CONVERSION, IN GENERAL
1Analogue/digital conversion; Digital/analogue conversion
10Calibration or testing
G01R 31/28 2006.1
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
CPC
G01R 31/3167
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
3167Testing of combined analog and digital circuits
H03M 1/108
HELECTRICITY
03BASIC ELECTRONIC CIRCUITRY
MCODING; DECODING; CODE CONVERSION IN GENERAL
1Analogue/digital conversion; Digital/analogue conversion
10Calibration or testing
1071Measuring or testing
108Converters having special provisions for facilitating access for testing purposes
Applicants
  • NXP B.V. [NL]/[NL] (AllExceptUS)
  • ONETE, Cristian Nicolae [RO]/[NL] (UsOnly)
Inventors
  • ONETE, Cristian Nicolae
Agents
  • WILLIAMSON, Paul
Priority Data
61/098,20018.09.2008US
Publication Language English (en)
Filing Language English (EN)
Designated States
Title
(EN) COMPARATOR TESTING IN A FLASH A/D CONVERTER
(FR) TEST DE COMPARATEUR DANS UN CONVERTISSEUR A/N FLASH
Abstract
(EN) The present disclosure relates to a testing circuit and a testing method of the comparators incorporated in a flash A/D converter. The testing circuit uses reconfigurable A/D converters to easily test and identify the defective comparators.
(FR) La présente invention porte sur un circuit de test et un procédé de test des comparateurs incorporés dans un convertisseur A/N flash. Le circuit de test utilise des convertisseurs A/N reconfigurables pour tester et identifier facilement les comparateurs défectueux.
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