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1. (WO2010029709) TESTING DEVICE, TESTING METHOD, CIRCUIT SYSTEM, POWER SUPPLY DEVICE, POWER SUPPLY EVALUATION DEVICE, AND METHOD FOR EMULATING POWER SUPPLY ENVIRONMENT
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2010/029709    International Application No.:    PCT/JP2009/004357
Publication Date: 18.03.2010 International Filing Date: 03.09.2009
IPC:
G01R 31/28 (2006.01), G11C 29/56 (2006.01)
Applicants: ADVANTEST CORPORATION [JP/JP]; 1-32-1, Asahi-cho, Nerima-ku, Tokyo 1790071 (JP) (For All Designated States Except US).
ISHIDA, Masahiro [JP/JP]; (JP) (For US Only).
OKAYASU, Toshiyuki [JP/JP]; (JP) (For US Only).
YAMAMOTO, Kazuhiro [JP/JP]; (JP) (For US Only)
Inventors: ISHIDA, Masahiro; (JP).
OKAYASU, Toshiyuki; (JP).
YAMAMOTO, Kazuhiro; (JP)
Agent: MORISHITA, Sakaki; (JP)
Priority Data:
PCT/JP2008/002509 10.09.2008 JP
Title (EN) TESTING DEVICE, TESTING METHOD, CIRCUIT SYSTEM, POWER SUPPLY DEVICE, POWER SUPPLY EVALUATION DEVICE, AND METHOD FOR EMULATING POWER SUPPLY ENVIRONMENT
(FR) DISPOSITIF D’ESSAI, PROCÉDÉ D’ESSAI, SYSTÈME DE CIRCUIT, DISPOSITIF D’ALIMENTATION ÉLECTRIQUE, DISPOSITIF D’ÉVALUATION D’ALIMENTATION ÉLECTRIQUE ET PROCÉDÉ D’ÉMULATION D’UN ENVIRONNEMENT D’ALIMENTATION ÉLECTRIQUE
(JA) 試験装置、試験方法、回路システム、ならびに電源装置、電源評価装置、電源環境のエミュレート方法
Abstract: front page image
(EN)A main power supply (10) supplies a power supply voltage (Vdd) to a power supply terminal (102) of a DUT (100).  A control pattern generation unit (22) generates a control pattern (CNT) including a pulse train.  A compensation circuit (20) injects a compensation current (Icmp) into the power supply terminal (102) of the DUT (100) from a path different from that of the main power supply (10) intermittently according to the control pattern (CNT).  A switch (20b) is provided between an output terminal of a voltage supply (20a) and the power supply terminal (102) of the DUT (100), and switched on and off according to the control pattern (CNT).
(FR)Une alimentation électrique principale (10) fournit une tension d’alimentation (Vdd) à une borne d’alimentation (102) d’un DUT (device under test) (100). Une unité de génération de profil de commande (22) génère un profil de commande (CNT) comportant un train d’impulsions. Un circuit de compensation (20) injecte par intermittence un courant de compensation (Icmp) dans la borne d’alimentation (102) du DUT (100) à partir d’un passage différent de celui de l’alimentation électrique principale (10) en fonction du profil de commande (CNT). Un commutateur (20b) est situé entre une borne de sortie d’une alimentation en tension (20a) et la borne d’alimentation (102) du DUT (100) et est activé et désactivé en fonction du profil de commande (CNT).
(JA) メイン電源10は、DUT100の電源端子102に電源電圧Vddを供給する。制御パターン生成部22は、パルス列を含む制御パターンCNTを生成する。補償回路20は、制御パターンCNTに応じて間欠的に、メイン電源10とは別の経路からDUT100の電源端子102に補償電流Icmpを注入する。スイッチ20bは電圧源20aの出力端子とDUT100の電源端子102の間に設けられ、制御パターンCNTに応じてオン、オフが切りかえられる。
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PE, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)