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1. WO2010007473 - INTEGRATED TESTING CIRCUITRY FOR HIGH-FREQUENCY RECEIVER INTEGRATED CIRCUITS

Publication Number WO/2010/007473
Publication Date 21.01.2010
International Application No. PCT/IB2008/052877
International Filing Date 17.07.2008
IPC
G01R 31/00 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
G01R 31/28 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
H04B 17/00 2006.01
HELECTRICITY
04ELECTRIC COMMUNICATION TECHNIQUE
BTRANSMISSION
17Monitoring; Testing
CPC
G01R 31/2822
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
282Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
2822of microwave or radiofrequency circuits
G01R 31/2851
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
2851Testing of integrated circuits [IC]
H04B 17/0085
HELECTRICITY
04ELECTRIC COMMUNICATION TECHNIQUE
BTRANSMISSION
17Monitoring; Testing
0082using service channels; using auxiliary channels
0085using test signal generators
Applicants
  • FREESCALE SEMICONDUCTOR, INC. [US]/[US] (AllExceptUS)
  • DEHLINK, Bernhard [AT]/[DE] (UsOnly)
  • REUTER, Ralf [DE]/[DE] (UsOnly)
Inventors
  • DEHLINK, Bernhard
  • REUTER, Ralf
Priority Data
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) INTEGRATED TESTING CIRCUITRY FOR HIGH-FREQUENCY RECEIVER INTEGRATED CIRCUITS
(FR) ÉLÉMENTS DE CIRCUIT DE TEST INTÉGRÉS POUR DES CIRCUITS INTÉGRÉS À RÉCEPTEUR HAUTE FRÉQUENCE
Abstract
(EN)
An integrated circuit (10) comprises a receiver (12) and an oscillator circuit (36, 42). The receiver has a first input port (HF port) (14) for receiving a first oscillatory input signal, a second input port (LO port) (16) for receiving a second oscillatory input signal, and an output port (18) for delivering an oscillatory output signal (IF signal) which is a function of both the first input signal and the second input signal. The oscillator circuit has a first output port (36) for delivering a first oscillatory signal (HF signal), and a second output port (42) for delivering a second oscillatory signal (LO signal). The first output port (36) of the oscillator circuit is coupled to the HF port (14), and the second output port (42) of the oscillator circuit is coupled to the LO port (16). The integrated circuit may be designed such that the HF port (14) may be disconnected from the first output port (36) of the oscillator circuit without affecting the operability of the receiver (12). An apparatus for testing the proper functioning of an integrated circuit (10) as described above and a method of producing a receiver are also disclosed. The method may facilitate testing a receiver die during production. In particular it may avoid the need for feeding high-frequency signals from an external apparatus to the die.
(FR)
L'invention porte sur un circuit intégré (10) comprenant un récepteur (12) et un circuit oscillateur (36, 42). Le récepteur présente un premier port d'entrée (port HF) (14) pour recevoir un premier signal d'entrée oscillatoire, un second port d'entrée (port LO) (16) pour recevoir un second signal d'entrée oscillatoire, et un port de sortie (18) pour délivrer un signal de sortie oscillatoire (signal IF), qui est une fonction à la fois du premier signal d'entrée et du second signal d'entrée. Le circuit oscillateur présente un premier port de sortie (36) pour délivrer un premier signal oscillatoire (signal HF), et un second port de sortie (42) pour délivrer un second signal oscillatoire (signal LO). Le premier port de sortie (36) du circuit oscillateur est couplé au port HF (14), et le second port de sortie (42) du circuit oscillateur est couplé au port LO (16). Le circuit intégré peut être conçu de telle sorte que le port HF (14) peut être déconnecté du premier port de sortie (36) du circuit oscillateur sans affecter le fonctionnement du récepteur (12). L'invention porte également sur un appareil pour tester le fonctionnement correct d'un circuit intégré (10) tel que décrit ci-dessus et sur un procédé pour produire un récepteur. Le procédé peut faciliter le test d'un dé de récepteur pendant la production. En particulier, on peut éviter d'avoir à alimenter le dé en signaux haute fréquence à partir d'un appareil externe.
Also published as
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