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1. WO2010004275 - SAMPLE HOLDER

Publication Number WO/2010/004275
Publication Date 14.01.2010
International Application No. PCT/GB2009/001692
International Filing Date 07.07.2009
IPC
G21K 5/08 2006.01
GPHYSICS
21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
5Irradiation devices
08Holders for targets or for objects to be irradiated
H01J 37/20 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
37Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
02Details
20Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
H01J 37/26 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
37Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
26Electron or ion microscopes; Electron- or ion-diffraction tubes
G01N 23/22 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
22by measuring secondary emission from the material
G02B 21/26 2006.01
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
24Base structure
26Stages; Adjusting means therefor
G01Q 30/08 2010.01
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
30Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
08Means for establishing or regulating a desired environmental condition within a sample chamber
CPC
B82Y 15/00
BPERFORMING OPERATIONS; TRANSPORTING
82NANOTECHNOLOGY
YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
15Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
G21K 5/08
GPHYSICS
21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
5Irradiation devices
08Holders for targets or for other objects to be irradiated
H01J 2237/2001
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
2237Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
20Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
2001Maintaining constant desired temperature
H01J 2237/2002
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
2237Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
20Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
2002Controlling environment of sample
H01J 2237/2008
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
2237Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
20Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
2008specially adapted for studying electrical or magnetical properties of objects
H01J 2237/206
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
2237Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
20Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
206Modifying objects while observing
Applicants
  • SILSON LIMITED [GB]/[GB] (AllExceptUS)
  • ANASTASI, Peter, A., F. [GB]/[GB] (UsOnly)
  • HOWARD, Anthony, M. [GB]/[GB] (UsOnly)
Inventors
  • ANASTASI, Peter, A., F.
  • HOWARD, Anthony, M.
Agents
  • RAYNOR, Simon, Mark
Priority Data
0812480.208.07.2008GB
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) SAMPLE HOLDER
(FR) PORTE-ÉCHANTILLON
Abstract
(EN)
A sample holder for use in a method of analysis using high-energy radiation, includes a frame (4) having a window (6) and a membrane (2) that extends across the window and has a surface (8) for supporting a sample. The membrane is substantially transparent to the high-energy radiation. A functional structure (10, 12, 14, 18, 22, 24, 26, 34, 36) is formed on the membrane, the functional structure providing additional functionality that allows selected parameters of a sample on the support surface to be measured and/or controlled.
(FR)
Un porte-échantillon, destiné à être utilisé dans un procédé d’analyse utilisant un rayonnement haute énergie, comprend un cadre comportant une fenêtre et une membrane qui s’étend à travers la fenêtre et comporte une surface destinée à soutenir un échantillon. La membrane est sensiblement transparente au rayonnement haute énergie. Une structure fonctionnelle est formée sur la membrane, la structure fonctionnelle offrant une fonctionnalité supplémentaire qui permet à des paramètres sélectionnés d’un échantillon se trouvant sur la surface de support d’être mesurés et/ou commandés.
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