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1. (WO2009143528) SURFACE EVALUATION EMPLOYING ORTHOGONAL FORCE MEASUREMENT
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2009/143528    International Application No.:    PCT/US2009/045191
Publication Date: 26.11.2009 International Filing Date: 26.05.2009
IPC:
G01N 3/46 (2006.01)
Applicants: HYSITRON INCORPORATED [US/US]; 10025 Valley View Road Minneapolis, MN 55344 (US) (For All Designated States Except US).
HANGEN, Ude, Dirk [DE/DE]; (DE) (For US Only)
Inventors: HANGEN, Ude, Dirk; (DE)
Agent: DICKE, Steven, E.; Dicke, Billig & Czaja, PLLC 100 S. Fifth Street Suite 2250 Minneapolis, MN 55402 (US)
Priority Data:
61/055,750 23.05.2008 US
12/471,036 22.05.2009 US
Title (EN) SURFACE EVALUATION EMPLOYING ORTHOGONAL FORCE MEASUREMENT
(FR) ÉVALUATION DE SURFACE UTILISANT UNE MESURE DE FORCE ORTHOGONALE
Abstract: front page image
(EN)A method for evaluating a performance of a substrate surface including applying a normal force with a probe to a surface of a substrate, the normal force being substantially perpendicular to the surface, and moving the probe across the surface to generate a force against and to scratch the surface, the force being substantially parallel to the surface and comprising a coaxial force along the scratch and an orthogonal force perpendicular to the scratch. The method further includes measuring a magnitude of the orthogonal force as the probe moves across the coating, and determining a fracture point of the surface by the probe based on changes in the magnitude of the orthogonal force.
(FR)L'invention concerne un procédé pour évaluer une performance d'une surface de substrat comprenant l'application d'une force normale avec une sonde sur une surface d'un substrat, la force normale étant sensiblement perpendiculaire à la surface, et le déplacement de la sonde sur la surface pour générer une force contre celle-ci et rayer la surface, la force étant sensiblement parallèle à la surface et comprenant une force coaxiale le long de la rayure et une force orthogonale perpendiculaire à la rayure. Le procédé comprend en outre la mesure d'une grandeur de la force orthogonale alors que la sonde se déplace sur le revêtement, et la détermination d'un point de fracture de la surface par la sonde en fonction des changements de la grandeur de la force orthogonale.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)