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1. (WO2009139290) ACTIVE MATRIX SUBSTRATE, DISPLAY DEVICE, METHOD FOR INSPECTING ACTIVE MATRIX SUBSTRATE, AND METHOD FOR INSPECTING DISPLAY DEVICE
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2009/139290    International Application No.:    PCT/JP2009/058317
Publication Date: 19.11.2009 International Filing Date: 28.04.2009
IPC:
G02F 1/1368 (2006.01), G09F 9/00 (2006.01), G09F 9/30 (2006.01)
Applicants: SHARP KABUSHIKI KAISHA [JP/JP]; 22-22, Nagaike-cho, Abeno-ku, Osaka-shi, Osaka 5458522 (JP) (For All Designated States Except US).
KAWAMURA Takehiko; (For US Only).
TANIMOTO Kazunori; (For US Only).
OGASAWARA Isao; (For US Only).
YOSHIDA Masahiro; (For US Only).
TAKIZAWA Hideaki; (For US Only)
Inventors: KAWAMURA Takehiko; .
TANIMOTO Kazunori; .
OGASAWARA Isao; .
YOSHIDA Masahiro; .
TAKIZAWA Hideaki;
Agent: IKEUCHI SATO & PARTNER PATENT ATTORNEYS; 26th Floor, OAP TOWER, 8-30, Tenmabashi 1-chome, Kita-ku, Osaka-shi, Osaka 5306026 (JP)
Priority Data:
2008-129866 16.05.2008 JP
Title (EN) ACTIVE MATRIX SUBSTRATE, DISPLAY DEVICE, METHOD FOR INSPECTING ACTIVE MATRIX SUBSTRATE, AND METHOD FOR INSPECTING DISPLAY DEVICE
(FR) SUBSTRAT DE MATRICE ACTIVE, DISPOSITIF D'AFFICHAGE, PROCÉDÉ POUR INSPECTER UN SUBSTRAT DE MATRICE ACTIVE ET PROCÉDÉ POUR INSPECTER UN DISPOSITIF D'AFFICHAGE
(JA) アクティブマトリクス基板、表示装置、アクティブマトリクス基板の検査方法、および表示装置の検査方法
Abstract: front page image
(EN)An active matrix substrate is provided with first inspection wirings (70, 75) and second inspection wirings (72, 77).  The first inspection wirings can input inspection signals to first switching elements not adjacent to each other among the first switching elements (69, 74), and can input inspection signals to second switching elements not adjacent to each other among the second switching elements (69, 74).  The second inspection wirings can input inspection signals to the first switching elements, which have no first inspection wiring connected thereto and not adjacent to each other among the first switching elements (69, 74), and can input inspection signals to the second switching elements (69, 74), which have no first inspection wiring connected thereto and not adjacent to each other among the second switching elements (69, 74).
(FR)L'invention porte sur un substrat de matrice active qui est pourvu de premiers câblages d'inspection (70, 75) et de seconds câblages d'inspection (72, 77). Les premiers câblages d'inspection peuvent entrer des signaux d'inspection dans des premiers éléments de commutation non adjacents entre eux parmi les premiers éléments de commutation (69, 74), et peuvent entrer des signaux d'inspection dans des seconds éléments de commutation non adjacents entre eux parmi les seconds éléments de commutation (69, 74). Les seconds câblages d'inspection peuvent entrer des signaux d'inspection dans les premiers éléments de commutation, qui n'ont pas de premier câblage d'inspection connecté à ceux-ci et non adjacents entre eux parmi les premiers éléments de commutation (69, 74), et peuvent entrer des signaux d'inspection dans les seconds éléments de commutation (69, 74), qui n'ont pas de premier câblage d'inspection connecté à ceux-ci et ne sont pas adjacents entre eux parmi les seconds éléments de commutation (69, 74).
(JA) 第1スイッチング素子(69,74)のうちで互いに隣接しない第1スイッチング素子へ検査信号を入力可能であり、かつ、第2スイッチング素子(69,74)のうちで互いに隣接しない第2スイッチング素子へ検査信号を入力可能な第1検査配線(70,75)と、第1スイッチング素子(69,74)のうち第1検査配線が接続されておらずかつ互いに隣接しない第1スイッチング素子へ検査信号を入力可能であり、かつ、第2スイッチング素子(69,74)のうち第1検査配線が接続されておらずかつ互いに隣接しない第2スイッチング素子(69,74)へ検査信号を入力可能な第2検査配線(72,77)とを備える。
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)