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1. (WO2009122393) A METHOD AND SYSTEM FOR PHOTOVOLTAIC CELL PRODUCTION YIELD ENHANCEMENT
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2009/122393    International Application No.:    PCT/IL2009/000299
Publication Date: 08.10.2009 International Filing Date: 16.03.2009
IPC:
H01L 31/00 (2006.01)
Applicants: BRIGHTVIEW SYSTEMS LTD. [IL/IL]; 25 BASEL STREET P.O. BOX 10152 49002 PETACH TIQWA (IL) (For All Designated States Except US).
NOY, Noam [IL/IL]; (IL) (For US Only)
Inventors: NOY, Noam; (IL)
Agent: BRONSTEIN, Rafi; (IL)
Priority Data:
61/040,914 31.03.2008 US
Title (EN) A METHOD AND SYSTEM FOR PHOTOVOLTAIC CELL PRODUCTION YIELD ENHANCEMENT
(FR) PROCÉDÉ ET SYSTÈME D'AMÉLIORATION DE RENDEMENT DE PRODUCTION DE CELLULES PHOTOVOLTAÏQUES
Abstract: front page image
(EN)A system and a method for photo voltaic thin film quality control The system illuminates an area of photo voltaic film, acquires the illuminated area and compares it with a predetermined image The difference between the images indicates on presence of photo voltaic thin film defects.
(FR)L'invention porte sur un système et un procédé de contrôle de qualité de film mince photovoltaïque. Le système éclaire une zone de film photovoltaïque, acquiert la zone éclairée et la compare à une image prédéterminée. La différence entre les images indique la présence de défauts du film mince photovoltaïque.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)