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1. WO2009116107 - METHOD FOR THE ANALYSIS OF SAMPLES AND SAMPLE

Publication Number WO/2009/116107
Publication Date 24.09.2009
International Application No. PCT/IT2008/000458
International Filing Date 08.07.2008
IPC
G01N 1/36 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
1Sampling; Preparing specimens for investigation
28Preparing specimens for investigation
36Embedding or analogous mounting of samples
CPC
G01N 1/36
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
1Sampling; Preparing specimens for investigation
28Preparing specimens for investigation ; including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
36Embedding or analogous mounting of samples
G01N 15/0618
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
15Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
06Investigating concentration of particle suspensions
0606by collecting particles on a support
0618of the filter type
Applicants
  • UNIVERSITA'DEGLI STUDI DI BRESCIA [IT]/[IT] (AllExceptUS)
  • DEPERO, Laura, E. [IT]/[IT] (UsOnly)
  • BONTEMPI, Elza [IT]/[IT] (UsOnly)
  • BORGESE, Laura [IT]/[IT] (UsOnly)
  • ZACCO, Annalisa [IT]/[IT] (UsOnly)
  • LUCCHINI, Roberto [IT]/[IT] (UsOnly)
Inventors
  • DEPERO, Laura, E.
  • BONTEMPI, Elza
  • BORGESE, Laura
  • ZACCO, Annalisa
  • LUCCHINI, Roberto
Agents
  • PULIERI, Gianluca, Antonio
Priority Data
Publication Language English (EN)
Filing Language Italian (IT)
Designated States
Title
(EN) METHOD FOR THE ANALYSIS OF SAMPLES AND SAMPLE
(FR) PROCÉDÉ D'ANALYSE D'ÉCHANTILLONS ET ÉCHANTILLON
Abstract
(EN)
The present invention relates to a method for the analysis of a sample by means of radiation, for example using X-ray techniques. The method comprises a first step of providing a substrate, for example a filter, having an substantially flat shape and comprising a first and a second main surface. The method further comprises a step of depositing an analyte on the substrate, for example a particulate, and a step of coating at least a first area comprising the analyte of at least one of the main surfaces with a layer or film, to obtain a sample at least partially coated. Such film is at least partially permeable to the radiation used in the analysis. Furthermore the method comprises a step of analysing the first coated area of the sample by means of the radiation passing through the film.
(FR)
L'invention concerne un procédé destiné à analyser un échantillon au moyen d'un rayonnement, par exemple à l’aide de techniques de rayons X. Le procédé inclut une première opération de fourniture d'un substrat, par exemple un filtre, possédant une forme sensiblement plane et comportant des première et seconde surfaces principales. Le procédé inclut en outre une opération de dépôt d'une substance à analyser, par exemple une matière particulaire, sur le substrat et une opération de revêtement d'au moins une première zone incluant la substance à analyser d'au moins une des surfaces principales avec une couche ou un film, de façon à obtenir un échantillon au moins partiellement enduit. Un tel film est au moins partiellement perméable au rayonnement utilisé dans l'analyse. De plus, le procédé inclut une opération d'analyse de la première zone enduite de l'échantillon au moyen du rayonnement passant par le film.
Also published as
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