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1. (WO2009071965) SEMICONDUCTOR DEVICE AND APPARATUS INCLUDING SEMICONDUCTOR DEVICE
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2009/071965 International Application No.: PCT/IB2007/054949
Publication Date: 11.06.2009 International Filing Date: 06.12.2007
IPC:
H03K 17/0814 (2006.01) ,H03K 19/003 (2006.01)
H ELECTRICITY
03
BASIC ELECTRONIC CIRCUITRY
K
PULSE TECHNIQUE
17
Electronic switching or gating, i.e. not by contact-making and -breaking
08
Modifications for protecting switching circuit against overcurrent or overvoltage
081
without feedback from the output circuit to the control circuit
0814
by measures taken in the output circuit
[IPC code unknown for H03K 19/03]
Applicants:
FREESCALE SEMICONDUCTOR, INC. [US/US]; 6501 William Cannon Drive West Austin, Texas 78735, US (AllExceptUS)
ROTH, Andreas [DE/DE]; DE (UsOnly)
BODE, Hubert [DE/DE]; DE (UsOnly)
LAUDENBACH, Andreas [DE/DE]; DE (UsOnly)
LEHMANN, Stephan [DE/DE]; DE (UsOnly)
WITTICH, Engelbert [DE/DE]; DE (UsOnly)
Inventors:
ROTH, Andreas; DE
BODE, Hubert; DE
LAUDENBACH, Andreas; DE
LEHMANN, Stephan; DE
WITTICH, Engelbert; DE
Priority Data:
Title (EN) SEMICONDUCTOR DEVICE AND APPARATUS INCLUDING SEMICONDUCTOR DEVICE
(FR) DISPOSITIF SEMI-CONDUCTEUR ET APPAREIL COMPRENANT UN DISPOSITIF SEMI-CONDUCTEUR
Abstract:
(EN) A semiconductor device includes a substrate (1) on which an electronic circuit (40) is provided. One or more pads may be present which can connect the electronic circuit to an external device outside the substrate. A current meter (50) is electrically in contact with at least a part of the substrate and/or the pad. The meter can measure a parameter forming a measure for an amount of a current flowing between the substrate and at least one of the at least one pad. A control unit (60) is connected to the current meter (50) and the electronic circuit (40), for controlling the electronic circuit based on the measured parameter.
(FR) Un dispositif semi-conducteur selon l'invention comprend un substrat (1) sur lequel un circuit électronique (40) est disposé. Une ou plusieurs plages de connexion peuvent être présentes, lesquelles peuvent connecter le circuit électronique à un dispositif externe à l'extérieur du substrat. Un ampèremètre (50) est en contact électrique avec au moins une partie du substrat et/ou de la plage de connexion. L'ampèremètre peut mesurer un paramètre formant une mesure pour une quantité d'un courant circulant entre le substrat et au moins l'une de la ou des différentes plages de connexion. Une unité de commande (60) est connectée à l'ampèremètre (50) et au circuit électronique (40), pour commander le circuit électronique sur la base du paramètre mesuré.
front page image
Designated States: AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LT, LU, LV, MC, MT, NL, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)
Also published as:
EP2229730US20100277205EP2552024