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Machine translation
1. (WO2009064820) IMPROVED ELECTRONIC COMPONENT HANDLER TEST PLATE
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2009/064820    International Application No.:    PCT/US2008/083291
Publication Date: 22.05.2009 International Filing Date: 13.11.2008
IPC:
G01R 31/26 (2006.01), H01G 13/00 (2006.01), B07C 5/344 (2006.01)
Applicants: ELECTRO SCIENTIFIC INDUSTRIES, INC. [US/US]; 13900 NW Science Park Dr., Portland, OR 97229 (US) (For All Designated States Except US).
BOE, Gerald, F. [US/US]; (US) (For US Only)
Inventors: BOE, Gerald, F.; (US)
Agent: KNIGHT, Michelle, L.; Young Basile Hanlon Macfarlane & Helmholdt, PC, 3001 West Big Beaver Rd., Ste. 624, Troy, MI 48084 (US)
Priority Data:
11/941,412 16.11.2007 US
Title (EN) IMPROVED ELECTRONIC COMPONENT HANDLER TEST PLATE
(FR) PLAQUE D'ESSAIS D'UN MANIPULATEUR AMÉLIORÉ DE COMPOSANTS ÉLECTRONIQUES
Abstract: front page image
(EN)An improved electronic component handler and associated improved test plate are described. A guide on the test plate is used to intersect the testing apertures to eliminate misalignment of the component loading frame and the aperture to ensure easy insertion of components into the test apertures.
(FR)L'invention porte sur un manipulateur amélioré de composants électroniques et sur la plaque d'essais associée. Un guide disposé sur la plaque d'essais croise les ouvertures d'essai pour éliminer les défauts d'alignement du cadre de chargement des composants et des ouvertures afin de favoriser l'insertion des composants dans les ouvertures d'essai.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MT, NL, NO, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)