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1. WO2009007499 - MEASURING ARRANGEMENT AND METHOD

Publication Number WO/2009/007499
Publication Date 15.01.2009
International Application No. PCT/FI2008/050376
International Filing Date 19.06.2008
IPC
G01L 1/25 2006.01
GPHYSICS
01MEASURING; TESTING
LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
1Measuring force or stress, in general
25using wave or particle radiation, e.g. X-rays, neutrons
G01D 5/32 2006.01
GPHYSICS
01MEASURING; TESTING
DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; TRANSFERRING OR TRANSDUCING ARRANGEMENTS NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
5Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
26using optical means, i.e. using infra-red, visible or ultra-violet light
32with attenuation or whole or partial obturation of beams of light
G01B 11/02 2006.01
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11Measuring arrangements characterised by the use of optical means
02for measuring length, width, or thickness
G01B 21/30 2006.01
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
21Measuring arrangements or details thereof in so far as they are not adapted to particular types of measuring means of the other groups of this subclass
30for measuring roughness or irregularity of surfaces
G01N 13/10 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
13Investigating surface or boundary effects, e.g. wetting power; Investigating diffusion effects; Analysing materials by determining surface, boundary, or diffusion effects
10Investigating or analysing surface structures in atomic ranges using scanning-probe techniques
G01L 1/04 2006.01
GPHYSICS
01MEASURING; TESTING
LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
1Measuring force or stress, in general
04by measuring elastic deformation of gauges, e.g. of springs
CPC
G01B 11/303
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11Measuring arrangements characterised by the use of optical means
30for measuring roughness or irregularity of surfaces
303using photoelectric detection means
G01B 5/28
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
5Measuring arrangements characterised by the use of mechanical means
28for measuring roughness or irregularity of surfaces
Applicants
  • OULUN YLIOPISTO [FI]/[FI] (AllExceptUS)
  • PUDAS, Markko Tapani [FI]/[FI] (UsOnly)
  • KIVIJAKOLA, Janne [FI]/[FI] (UsOnly)
  • TUUKKANEN, Tuomas [FI]/[FI] (UsOnly)
  • VÄHÄSÖYRINKI, Mikko [FI]/[FI] (UsOnly)
Inventors
  • PUDAS, Markko Tapani
  • KIVIJAKOLA, Janne
  • TUUKKANEN, Tuomas
  • VÄHÄSÖYRINKI, Mikko
Agents
  • KOLSTER OY AB
Priority Data
2007552706.07.2007FI
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) MEASURING ARRANGEMENT AND METHOD
(FR) DISPOSITIF ET PROCÉDÉ DE MESURE
Abstract
(EN)
A measuring arrangement comprising a radiation source a detector for detecting radiation emitted by the radiation source and to provide a detection level indicator indicating the quantity of the detected radiation, a measuring element configured to bend in relation to a force affecting the measuring element, a screening element attached to or consisting of the measuring element movable in the radiation at least partly hindering the radiation of entering the detector and a moving unit configured to change the relative position of the screening element between the radiation source and the detector until the detector level indicator reaches a high-sensitivity measurement area of the detection level indicator.
(FR)
L'invention concerne un dispositif de mesure comprenant une source de rayonnement, un détecteur pour détecter le rayonnement émis par la source de rayonnement et pour fournir un indicateur de niveau de détection indiquant la quantité du rayonnement détecté, un élément de mesure configuré pour se courber en fonction d'une force affectant l'élément de mesure, un élément de criblage fixé à ou consistant en l'élément de mesure mobile dans le rayonnement, gênant au moins partiellement l'entrée du rayonnement dans le détecteur, et une unité mobile configurée pour changer la position relative de l'élément de criblage entre la source de rayonnement et le détecteur jusqu'à ce que l'indicateur de niveau de détecteur atteigne une zone de mesure de sensibilité élevée de l'indicateur de niveau de détection.
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