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1. WO2009004609 - MAGNETIC FIELD SENSOR DEVICE FOR DIRECT MAGNETIC FIELD IMAGING AND METHOD OF FABRICATION THEREOF

Publication Number WO/2009/004609
Publication Date 08.01.2009
International Application No. PCT/IL2008/000876
International Filing Date 26.06.2008
IPC
G01R 33/038 2006.1
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
33Arrangements or instruments for measuring magnetic variables
02Measuring direction or magnitude of magnetic fields or magnetic flux
038using permanent magnets, e.g. balances, torsion devices
CPC
G01Q 60/56
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
60Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
50MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes
54Probes, their manufacture, or their related instrumentation, e.g. holders
56Probes with magnetic coating
G01R 33/0354
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
33Arrangements or instruments for measuring magnetic variables
02Measuring direction or magnitude of magnetic fields or magnetic flux
035using superconductive devices
0354SQUIDS
G01R 33/0385
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
33Arrangements or instruments for measuring magnetic variables
02Measuring direction or magnitude of magnetic fields or magnetic flux
038using permanent magnets, e.g. balances, torsion devices
0385in relation with magnetic force measurements
H01L 39/2493
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
39Devices using superconductivity; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof
24Processes or apparatus peculiar to the manufacture or treatment of devices provided for in H01L39/00 or of parts thereof
2493for Josephson devices
Y10T 29/49227
YSECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
10TECHNICAL SUBJECTS COVERED BY FORMER USPC
TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
29Metal working
49Method of mechanical manufacture
49002Electrical device making
49227Insulator making
Applicants
  • YEDA RESEARCH AND DEVELOPMENT COMPANY LTD. [IL]/[IL] (AllExceptUS)
  • FINKLER, Amit [IL]/[IL] (UsOnly)
  • MARTIN, Jens [DE]/[IL] (UsOnly)
  • MYASOEDOV, Yuri [IL]/[IL] (UsOnly)
  • SEGEV, Yehonathan [IL]/[IL] (UsOnly)
  • YACOBY, Amir [IL]/[IL] (UsOnly)
  • ZELDOV, Eli [IL]/[IL] (UsOnly)
Inventors
  • FINKLER, Amit
  • MARTIN, Jens
  • MYASOEDOV, Yuri
  • SEGEV, Yehonathan
  • YACOBY, Amir
  • ZELDOV, Eli
Agents
  • REINHOLD COHN AND PARTNERS
Priority Data
60/948,02505.07.2007US
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) MAGNETIC FIELD SENSOR DEVICE FOR DIRECT MAGNETIC FIELD IMAGING AND METHOD OF FABRICATION THEREOF
(FR) DISPOSITIF DE CAPTEUR DE CHAMP MAGNÉTIQUE POUR UNE IMAGERIE À CHAMP MAGNÉTIQUE DIRECT ET PROCÉDÉ DE FABRICATION DE CELUI-CI
Abstract
(EN)
The present invention discloses a novel magnetic sensor device performing direct magnetic field imaging, comprising a probe having a conical tip portion which is configured as a sensor having two superconductors separated by a thin non-superconducting layer (such as a Josephson junction based sensor), where the non-superconducting layer is located at the apex portion of said conical tip, thereby defining electron tunneling region(s) at said apex portion. The technique of the present invention enables the sensor device to be very small and to be brought very close to the sample surface.
(FR)
La présente invention concerne un nouveau dispositif de capteur magnétique effectuant une imagerie à champ magnétique directe, le dispositif comprenant une sonde et une partie de pointe conique qui est configurée sous la forme d'un capteur possédant deux supraconducteurs séparés par une couche mince non supraconductrice (telle qu'un capteur basé sur une jonction Josephson), la couche non supraconductrice étant située au niveau de la partie de sommet de ladite pointe conique, définissant ainsi une ou plusieurs régions de canalisation électronique au niveau de ladite partie de sommet. La technique de la présente invention permet au dispositif de capteur d'être très petit et d'être amené en contact très proche avec la surface d'échantillon.
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