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Machine translation
1. (WO2008102632) X-RAY BANDPASS FILTER, X-RAY IRRADIATION SYSTEM AND X-RAY PHOTOGRAPHING SYSTEM
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2008/102632    International Application No.:    PCT/JP2008/051741
Publication Date: 28.08.2008 International Filing Date: 04.02.2008
IPC:
A61B 6/00 (2006.01), G21K 1/06 (2006.01), G21K 3/00 (2006.01)
Applicants: Konica Minolta Medical & Graphic, Inc. [JP/JP]; 1, Sakura-machi, Hino-shi, Tokyo 1918511 (JP) (For All Designated States Except US).
TAMAKOSHI, Yasuaki [JP/JP]; (JP) (For US Only)
Inventors: TAMAKOSHI, Yasuaki; (JP)
Priority Data:
2007-041337 21.02.2007 JP
Title (EN) X-RAY BANDPASS FILTER, X-RAY IRRADIATION SYSTEM AND X-RAY PHOTOGRAPHING SYSTEM
(FR) FILTRE PASSE-BANDE DE RAYONS X, SYSTÈME D'IRRADIATION DE RAYONS X ET SYSTÈME DE RADIOGRAPHIE
(JA) X線バンドパスフィルタ、X線照射システム及びX線撮影システム
Abstract: front page image
(EN)Provided is a bandpass filter, which can take out an X-ray having a desired wavelength from X-rays having a wavelength of 1Å or shorter, and is applicable for various x-ray photography. The x-ray bandpass filter is provided with an x-ray refractive lens for refracting x-rays, and an x-ray blocking member having a slit or a hole at a position where the x-rays, which are refracted by the x-ray refractive lens and have the desired wavelength, are focused.
(FR)L'invention concerne un filtre passe-bande de rayons X qui peut éliminer un rayonnement X de longueur d'onde voulue provenant de rayons X dont la longueur d'onde est égale ou inférieure à 1Å, et peut être appliqué à divers types de radiographie. Le filtre passe-bande de rayons X comporte une lentille de réfraction de rayons X pour réfracter les rayons X, et un élément de blocage de rayons X comportant une fente ou un trou en un point où sont concentrés les rayons X ayant été réfractés par ladite lentille et qui présentent la longueur d'onde voulue.
(JA) 本発明は、波長1Å以下のX線から所望波長のX線を取り出すことを可能とし、種々のX線撮影に対応可能なバンドパスフィルタを提供する。 このX線バンドパスフィルタには、X線を屈折させるX線屈折レンズと、X線屈折レンズにより屈折された所望波長のX線が集光する位置に設けられたスリットまたは孔を有するX線遮蔽部材とが備えられていることを特徴とする。
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MT, NL, NO, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)