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Machine translation
1. (WO2008096852) HONEYCOMB STRUCTURE FOR FINE PARTICLE SENSOR
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2008/096852    International Application No.:    PCT/JP2008/052133
Publication Date: 14.08.2008 International Filing Date: 08.02.2008
IPC:
F01N 3/02 (2006.01), B01D 39/20 (2006.01), B01D 46/42 (2006.01), F01N 3/28 (2006.01)
Applicants: NGK INSULATORS, LTD. [JP/JP]; 2-56, Suda-cho, Mizuho-ku, Nagoya-shi, Aichi 4678530 (JP) (For All Designated States Except US).
KATSUYAMA, Kyosuke [JP/JP]; (JP) (For US Only).
KITOH, Kenshin [JP/JP]; (JP) (For US Only).
MIYAIRI, Yukio [JP/JP]; (JP) (For US Only).
SAKUMA, Takeshi [JP/JP]; (JP) (For US Only).
SUZUKI, Junichi [JP/JP]; (JP) (For US Only)
Inventors: KATSUYAMA, Kyosuke; (JP).
KITOH, Kenshin; (JP).
MIYAIRI, Yukio; (JP).
SAKUMA, Takeshi; (JP).
SUZUKI, Junichi; (JP)
Agent: WATANABE, Kazuhira; 3rd Fl., No.8 Kikuboshi Tower Building 20-18, Asakusabashi 3-chome Taito-ku, Tokyo 1110053 (JP)
Priority Data:
2007-031045 09.02.2007 JP
Title (EN) HONEYCOMB STRUCTURE FOR FINE PARTICLE SENSOR
(FR) STRUCTURE EN NID D'ABEILLE POUR UN CAPTEUR DE FINE PARTICULE
(JA) 微粒子センサ用ハニカム構造体
Abstract: front page image
(EN)Provided is a sensor to be used for on-board diagnosis of fine particles. A honeycomb structure with an electrode is provided with a fine particle adhesion rate improving means or a sensitivity improving means at least on one end surface.
(FR)L'invention concerne un capteur à utiliser pour un diagnostic embarqué de fines particules. Une structure en nid d'abeille munie d'une électrode comporte un moyen d'améliorer la vitesse d'adhésion de fines particules ou un moyen d'améliorer la sensibilité au moins sur une surface d'extrémité.
(JA) 微粒子の車上診断に使用し得るセンサを提供する。  少なくとも一方の端面に微粒子付着率向上手段または感度向上手段を備えた電極付ハニカム構造体である。
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MT, NL, NO, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)