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1. (WO2008090261) A SPECTROMETER AND A METHOD FOR CONTROLLING THE SPECTROMETER
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2008/090261 International Application No.: PCT/FI2008/050023
Publication Date: 31.07.2008 International Filing Date: 23.01.2008
IPC:
G01J 3/26 (2006.01) ,G01N 21/17 (2006.01) ,G01N 21/64 (2006.01)
G PHYSICS
01
MEASURING; TESTING
J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
3
Spectrometry; Spectrophotometry; Monochromators; Measuring colours
12
Generating the spectrum; Monochromators
26
using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filter
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
62
Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
63
optically excited
64
Fluorescence; Phosphorescence
Applicants:
VALTION TEKNILLINEN TUTKIMUSKESKUS [FI/FI]; Vuorimiehentie 3 FI-02150 Espoo, FI (AllExceptUS)
SAARI, Heikki [FI/FI]; FI (UsOnly)
Inventors:
SAARI, Heikki; FI
Agent:
SEPPO LAINE OY; Itämerenkatu 3 B FI-00180 Helsinki, FI
Priority Data:
0701536.526.01.2007GB
Title (EN) A SPECTROMETER AND A METHOD FOR CONTROLLING THE SPECTROMETER
(FR) SPECTROMÈTRE ET PROCÉDÉ POUR COMMANDER LE SPECTROMÈTRE
Abstract:
(EN) The invention relates to a spectrometer for material analysis and to a control method for a spectrometer. The spectrometer includes a radiant source (140) formed by multiple single radiation sources (141) having different central wavelengths, for generating a measuring signal, a measurement object (100) containing a material to be analyzed, at least one electrically tunable Fabry-Perot filter (120, 220) for the band pass filtering the measuring signal by at least two pass bands, and a detector (300, 400) for detecting said filtered measuring signals received from the measurement object (100). In accordance with the invention the spectrometer has means (312) for modulating each of the single radiation sources (141) and correspondingly means (307, 309) for demodulating the detected signals such that the signal from each single radiation source can be distinguished from each other in the detector (300, 400), and the spectrometer has means for detecting (300, 400) and demodulating (306, 307) multiple pass bands simultaneously.
(FR) La présente invention concerne un spectromètre pour analyser un matériau et un procédé de commande de spectromètre. Ledit spectromètre comprend une source radiante (140) formée de multiples sources de radiation unique (141) ayant des longueurs d'onde centrales différentes, pour générer un signal de mesure, un objet de mesure (100) contenant un matériau à analyser, au moins un filtre Fabry-Perot réglable électriquement (120, 220) pour la bande passante filtrant le signal de mesure au moyen d'au moins deux bandes passantes, et un détecteur (300, 400) pour détecter lesdits signaux de mesure reçus depuis l'objet de mesure (100). Selon l'invention le spectromètre a des moyens (312) pour moduler chacune des sources de radiation unique (141) et des moyens correspondants (307, 309) pour démoduler les signaux détectés de sorte que le signal depuis chaque source de radiation unique puisse être distingué des autres dans le détecteur (300, 400) et le spectromètre a des moyens pour détecter (300, 400) et démoduler (306, 307) plusieurs bandes passantes de manière simultanée.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MT, NL, NO, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)
Also published as:
EP2106537US20100097613