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1. WO2008021520 - SPECTRAL FILTER SYSTEM FOR INFRARED IMAGING OF SUBSTRATES THROUGH COATINGS

Publication Number WO/2008/021520
Publication Date 21.02.2008
International Application No. PCT/US2007/018307
International Filing Date 17.08.2007
IPC
G01N 21/88 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
84Systems specially adapted for particular applications
88Investigating the presence of flaws, defects or contamination
G01N 21/35 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
35using infra-red light
CPC
G01J 2005/0077
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
5Radiation pyrometry
0077Imaging
G01N 2021/8472
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
84Systems specially adapted for particular applications
8472Investigation of composite materials
G01N 21/35
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
35using infra-red light
G01N 21/3563
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
35using infra-red light
3563for analysing solids; Preparation of samples therefor
G01N 21/8422
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
84Systems specially adapted for particular applications
8422Investigating thin films, e.g. matrix isolation method
G01N 21/88
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
84Systems specially adapted for particular applications
88Investigating the presence of flaws or contamination
Applicants
  • NORTHROP GRUMMAN CORPORATION [US]/[US] (AllExceptUS)
  • DIMARZIO, Donald [US]/[US] (UsOnly)
  • WEIR, John, Douglas [US]/[US] (UsOnly)
  • CHU, Steven [US]/[US] (UsOnly)
  • FONNELAND, Nils, Jakob [US]/[US] (UsOnly)
  • LEYBLE, Dennis, John [US]/[US] (UsOnly)
Inventors
  • DIMARZIO, Donald
  • WEIR, John, Douglas
  • CHU, Steven
  • FONNELAND, Nils, Jakob
  • LEYBLE, Dennis, John
Agents
  • TOWNER, Alan, G.
Priority Data
11/506,70118.08.2006US
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) SPECTRAL FILTER SYSTEM FOR INFRARED IMAGING OF SUBSTRATES THROUGH COATINGS
(FR) SYSTÈME DE FILTRE SPECTRAL DESTINÉ À UNE IMAGERIE INFRAROUGE DE SUBSTRATS À TRAVERS DES REVÊTEMENTS
Abstract
(EN)
An improved system for visual inspection of substrates (12) coated with paints (14) and polymers is disclosed. Painted substrates (10) can be inspected for environmental and physical damage such as corrosion and cracks without removing the paint (14). The present invention provides the ability to maximize paint thickness penetration. This is accomplished with a spectral bandpass filter (15) that rejects reflected light from the coating opaque bands, while allowing light in the paint window to pass to an IR detector (16) such as an IR camera focal plane. The narrow bandpass range enhances the ability for IR imaging to see through thicker paint layers and improves the contrast over standard commercial ER mid-wave cameras. The bandpass may be adjusted to coincide with the full spectral window of the paint, consistent with the ability of the imaging focal plane to detect light in the spectral region.
(FR)
L'invention concerne un système amélioré permettant une inspection visuelle de substrats revêtus de peintures et de polymères. Des substrats paints peuvent être inspectés pour rechercher des dommages environnementaux et physiques, notamment de la corrosion et des fissures, sans retirer la peinture de ces substrats. L'invention permet de maximiser la pénétration dans l'épaisseur de peinture. Ceci s'accomplit à l'aide d'un filtre passe-bande qui rejette la lumière réfléchie par les bandes opaques du revêtement, tout en permettant à la lumière de la fenêtre de peinture de passer jusqu'au détecteur IR, notamment un plan focal de caméra IR. L'étroite étendue de la bande passante permet d'accroître la capacité de l'imagerie IR de voir à travers d'épaisses couches de peinture et d'améliorer le contraste par rapport à des caméras à infrarouge de longueurs d'onde moyennes. La bande passante peut être ajustée pour coïncider avec la fenêtre spectrale entière de la peinture, ce qui permet d'imager un plan focal pour détecter la lumière de la zone spectrale.
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