Processing

Please wait...

Settings

Settings

Goto Application

1. WO2007147968 - METHOD OF ANALYSING AN INTEGRATED CIRCUIT, METHOD OF OBSERVATION AND THEIR ASSOCIATED INSTALLATIONS

Publication Number WO/2007/147968
Publication Date 27.12.2007
International Application No. PCT/FR2007/001014
International Filing Date 19.06.2007
IPC
G01R 31/311 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
302Contactless testing
308using non-ionising electromagnetic radiation, e.g. optical radiation
311of integrated circuits
CPC
G01R 31/311
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
302Contactless testing
308using non-ionising electromagnetic radiation, e.g. optical radiation
311of integrated circuits
Applicants
  • CENTRE NATIONAL D'ETUDES SPATIALES [FR]/[FR] (AllExceptUS)
  • DESPLATS, Romain [FR]/[FR] (UsOnly)
  • SANCHEZ, Kevin [FR]/[FR] (UsOnly)
Inventors
  • DESPLATS, Romain
  • SANCHEZ, Kevin
Agents
  • BLOT, Philippe
Priority Data
06 0543519.06.2006FR
Publication Language French (FR)
Filing Language French (FR)
Designated States
Title
(EN) METHOD OF ANALYSING AN INTEGRATED CIRCUIT, METHOD OF OBSERVATION AND THEIR ASSOCIATED INSTALLATIONS
(FR) PROCEDE D'ANALYSE D'UN CIRCUIT INTEGRE, PROCEDE D'OBSERVATION ET LEURS INSTALLATIONS ASSOCIEES
Abstract
(EN)
The invention relates to a method of analysing an integrated circuit comprising: a step (102) of applying laser radiation at a point on the surface of the circuit; a step (106) of exciting the circuit thus subjected to the laser radiation by applying an electrical excitation signal; a step (106) for receiving the response to the excitation of the circuit subjected to the laser radiation; a step (106) of measuring the phase difference between the response to the excitation of the circuit subjected to the laser radiation and a reference response of the circuit in the absence of laser radiation applied to the circuit. The invention also relates to an associated method of observation and an associated observation installation.
(FR)
L'invention concerne un procédé d'analyse d'un circuit intégré comportant : une étape (102) d'application d'un rayonnement laser en un point de la surface du circuit; une étape (106) d'excitation du circuit ainsi soumis au rayonnement laser par application d'un signal électrique d'excitation; une étape (106) de recueil de la réponse du circuit à l'excitation soumis au rayonnement laser; une étape (106) de mesure de la différence de phase entre la réponse à l'excitation du circuit soumis au rayonnement laser et une réponse de référence du circuit en l'absence de rayonnement laser appliqué au circuit. L'invention concerne également un procédé et une installation d'observation associés.
Other related publications
Latest bibliographic data on file with the International Bureau