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1. WO2007146581 - METHOD OF EXPANDING TESTER DRIVE AND MEASUREMENT CAPABILITY

Publication Number WO/2007/146581
Publication Date 21.12.2007
International Application No. PCT/US2007/069798
International Filing Date 25.05.2007
IPC
G01R 31/02 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
02Testing of electric apparatus, lines, or components for short-circuits, discontinuities, leakage, or incorrect line connection
G01R 31/26 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
26Testing of individual semiconductor devices
G01R 31/28 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
G01R 31/00 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
CPC
G01R 1/07342
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
073Multiple probes
07307with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
07342the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
G01R 31/2889
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
2851Testing of integrated circuits [IC]
2886Features relating to contacting the IC under test, e.g. probe heads; chucks
2889Interfaces, e.g. between probe and tester
Applicants
  • FORMFACTOR, INC. [US]/[US] (AllExceptUS)
  • MILLER, Charles, A. [US]/[US] (UsOnly)
Inventors
  • MILLER, Charles, A.
Agents
  • MERKADEAU, Stuart, L.
Priority Data
11/422,57306.06.2006US
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) METHOD OF EXPANDING TESTER DRIVE AND MEASUREMENT CAPABILITY
(FR) PROCÉDÉ D'EXTENSION D'UNE COMMANDE D'ÉQUIPEMENT D'ESSAI ET CAPACITÉ DE MESURE
Abstract
(EN)
A probe card assembly can comprise an interface, which can be configured to receive from a tester test signals for testing an electronic device. The probe card assembly can further comprise probes for contacting the electronic device and electronic driver circuits for driving the test signals to ones of the probes.
(FR)
Selon l'invention, un ensemble carte à pointes peut contenir une interface pouvant être configurée de manière à recevoir des signaux d'équipement d'essai pour tester un dispositif électronique. L'ensemble carte à pointes peut en outre contenir des pointes permettant le contact avec le dispositif électronique et des circuits électroniques de commande permettant de diriger les signaux d'essai vers l'une des pointes.
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