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Machine translation
1. (WO2007097559) PROBE PIN ASSEMBLY AND METHOD FOR MANUFACTURING THE SAME
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2007/097559    International Application No.:    PCT/KR2007/000882
Publication Date: 30.08.2007 International Filing Date: 20.02.2007
IPC:
H01L 21/66 (2006.01)
Applicants: SAEHANMICROTECH CO., LTD [KR/KR]; 739-4 Palya-ri, Jinjeop-eup, Namyangju-si, Gyeonggi-do 472-868 (KR) (For All Designated States Except US).
BAEK, Byeong Seon [KR/KR]; (KR) (For US Only).
GWAK, Sin Ung [KR/KR]; (KR) (For US Only)
Inventors: BAEK, Byeong Seon; (KR).
GWAK, Sin Ung; (KR)
Agent: DYNE PATENT & LAW FIRM; 3rd Floor, Shinmyeong Building, 645-21, Yeoksam-dong, Gangnam-gu, Seoul 135-910 (KR)
Priority Data:
10-2006-0016289 20.02.2006 KR
Title (EN) PROBE PIN ASSEMBLY AND METHOD FOR MANUFACTURING THE SAME
(FR) ENSEMBLE BROCHES DE SONDE ET SON PROCÉDÉ DE FABRICATION
Abstract: front page image
(EN)A probe pin assembly and a method for manufacturing the same are provided. The probe pin assembly includes elastically deformable probe pins of a straight shape each having a first end and a second end, each of the probe pins having a first stopper lug and a second stopper lug, an upper die having upper through-holes into which the first ends of the probe pins are inserted, each of the upper through-holes having a center axis, a lower die having lower through-holes into which the second ends of the probe pins are inserted, each of the lower through-holes having a center axis, the center axis of each of the upper through- holes being out of alignment with the center axis of each of the lower through-holes, and a housing to which the upper die and the lower die are fixedly secured.
(FR)L'invention porte sur un ensemble broches de sonde et sur son procédé de fabrication. L'ensemble broches de sonde comprend des broches de sonde à déformation élastique de forme droite, pourvues d'une première et d'une seconde extrémité, chacune des broches de sonde comportant une première et une seconde patte de fixation de butée, une puce supérieure comportant des trous traversants correspondants dans lesquels sont insérées les premières extrémités des broches de sonde, chacun de ces trous ayant un axe central; une puce inférieure comportant des trous traversants correspondants dans lesquels sont insérées les secondes extrémités des broches de sonde, chacun de ces trous ayant un axe central. L'axe central de chacun des trous traversants supérieurs n'est pas aligné sur l'axe central de chacun des trous traversants inférieurs. L'ensemble broche de sonde est également constitué d'un corps auquel sont fixées solidement la puce supérieure et la puce inférieure.
Designated States: AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KZ, LA, LC, LK, LR, LS, LT, LU, LV, LY, MA, MD, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: Korean (KO)