Processing

Please wait...

Settings

Settings

Goto Application

1. WO2007094287 - MEASURING DEVICE AND MEASURING METHOD

Publication Number WO/2007/094287
Publication Date 23.08.2007
International Application No. PCT/JP2007/052466
International Filing Date 13.02.2007
IPC
G01R 31/26 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
26Testing of individual semiconductor devices
G01R 29/02 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
29Arrangements for measuring or indicating electric quantities not covered by groups G01R19/-G01R27/135
02Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
CPC
G01R 15/22
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
15Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00 and G01R33/00 - G01R35/00
14Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
22using light-emitting devices, e.g. LED, optocouplers
G01R 31/2607
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
26Testing of individual semiconductor devices
2607Circuits therefor
G01R 31/2837
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
2832Specific tests of electronic circuits not provided for elsewhere
2836Fault-finding or characterising
2837Characterising or performance testing, e.g. of frequency response
Applicants
  • 株式会社アドバンテスト ADVANTEST CORPORATION [JP]/[JP] (AllExceptUS)
  • 天沼 聖司 AMANUMA, Seiji [JP]/[JP] (UsOnly)
Inventors
  • 天沼 聖司 AMANUMA, Seiji
Agents
  • 龍華 明裕 RYUKA, Akihiro
Priority Data
2006-04147817.02.2006JP
Publication Language Japanese (JA)
Filing Language Japanese (JA)
Designated States
Title
(EN) MEASURING DEVICE AND MEASURING METHOD
(FR) DISPOSITIF ET PROCEDE DE MESURE
(JA) 測定装置および測定方法
Abstract
(EN)
A measuring device measures at least one of switching times of output signals output by tested devices. The measuring device is comprised of a first light emitting unit for emitting light when a voltage of the output signals is not less than a first threshold voltage, a second light emitting unit for emitting light when a voltage of the output signals is not less than a second threshold voltage higher than the first threshold voltage, a first light receiving unit for receiving the light from the first light emitting unit, a second light receiving unit for receiving the light from the second light emitting unit, and a measuring unit for measuring a switching time between the first and second threshold voltages based on at least one difference of light emitting timing and distinguishing timing of the first and second light emitting units.
(FR)
La présente invention concerne un dispositif de mesure mesurant au moins un temps de commutation de signaux de sortie produits par des dispositifs à l'essai. Le dispositif de mesure comprend une première unité luminescente qui émet une lumière lorsqu'une tension des signaux de sortie n'est pas inférieure à une première tension de seuil, une seconde unité luminescente qui émet une lumière lorsqu'une tension des signaux de sortie n'est pas inférieure à une seconde tension de seuil supérieure à la première, une première unité photoréceptrice qui reçoit la lumière de la première unité luminescente, une seconde unité photoréceptrice qui reçoit la lumière de la seconde unité luminescente, et une unité de mesure qui mesure un temps de commutation entre la première et la seconde tension de seuil selon au moins une différence de durée d'émission lumineuse et qui distingue le réglage de la première et la seconde unité luminescente.
(JA)
 被試験デバイスが出力する出力信号のスイッチング時間の少なくとも1つを測定する測定装置であって、出力信号の電圧が第1しきい電圧以上となった場合に発光する第1発光部と、出力信号の電圧が第1しきい電圧より高い第2しきい電圧以上となった場合に発光する第2発光部と、第1発光部からの光を受光する第1受光部と、第2発光部からの光を受光する第2受光部と、第1発光部および第2発光部の発光タイミングおよび消光タイミングの少なくとも1つの差に基づいて、第1しきい電圧および第2しきい電圧の間のスイッチング時間を測定する測定部とを備える測定装置を提供する。
Latest bibliographic data on file with the International Bureau