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1. (WO2007010734) SEMICONDUCTOR APPARATUS AND METHOD OF TESTING SEMICONDUCTOR APPARATUS
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2007/010734 International Application No.: PCT/JP2006/313203
Publication Date: 25.01.2007 International Filing Date: 27.06.2006
IPC:
H01L 21/822 (2006.01) ,G01R 31/28 (2006.01) ,G06K 19/07 (2006.01) ,G11C 29/02 (2006.01) ,H01L 27/04 (2006.01)
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
L
SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
21
Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
70
Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in or on a common substrate or of specific parts thereof; Manufacture of integrated circuit devices or of specific parts thereof
77
Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
78
with subsequent division of the substrate into plural individual devices
82
to produce devices, e.g. integrated circuits, each consisting of a plurality of components
822
the substrate being a semiconductor, using silicon technology
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28
Testing of electronic circuits, e.g. by signal tracer
G PHYSICS
06
COMPUTING; CALCULATING; COUNTING
K
RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
19
Record carriers for use with machines and with at least a part designed to carry digital markings
06
characterised by the kind of the digital marking, e.g. shape, nature, code
067
Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards
07
with integrated circuit chips
G PHYSICS
11
INFORMATION STORAGE
C
STATIC STORES
29
Checking stores for correct operation; Testing stores during standby or offline operation
02
Detection or location of defective auxiliary circuits, e.g. defective refresh counters
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
L
SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
27
Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
02
including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
04
the substrate being a semiconductor body
Applicants:
RICOH COMPANY, LTD. [JP/JP]; 3-6, Nakamagome 1-chome, Ohta-ku, Tokyo 1438555, JP (AllExceptUS)
JINZAI, Takao [JP/JP]; JP (UsOnly)
Inventors:
JINZAI, Takao; JP
Agent:
ITOH, Tadahiko; 32nd Floor Yebisu Garden Place Tower 20-3, Ebisu 4-chome Shibuya-ku, Tokyo 1506032, JP
Priority Data:
2005-21151821.07.2005JP
Title (EN) SEMICONDUCTOR APPARATUS AND METHOD OF TESTING SEMICONDUCTOR APPARATUS
(FR) APPAREIL SEMI-CONDUCTEUR ET SA METHODE DE TEST
Abstract:
(EN) A semiconductor apparatus, configured to operate on different internal voltages generated from electromagnetic waves received via an antenna, to extract a command and data from the received electromagnetic waves, and to operate according to the extracted command, includes internal circuitry configured to generate and output binary signals according to a command input from the outside in a test operation for performing a predetermined test; and output circuits corresponding to some or all of the internal voltages and configured to convert the binary signals output from the internal circuitry into binary signals having same voltages as the corresponding internal voltages and to output the converted binary signals to the outside.
(FR) L'invention concerne un appareil semi-conducteur conçu pour fonctionner sur des tensions internes différentes générées à partir d'ondes électromagnétiques reçues par une antenne, pour extraire une instruction et des données à partir des ondes électromagnétiques reçues, et pour fonctionner selon l'instruction extraite. Cet appareil semi-conducteur comprend une circuiterie interne conçue pour générer et pour produire des signaux binaires selon une entrée d'instruction provenant de l'extérieur, dans une opération de test pour effectuer un test prédéterminé; et des circuits de sortie correspondant à une partie des tensions internes ou à toutes les tensions internes, et conçus pour convertir les signaux binaires produits par le circuit interne en signaux binaires présentant les mêmes tensions que les tensions internes correspondantes, et pour fournir les signaux binaires convertis à l'extérieur.
front page image
Designated States: AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, HN, HR, HU, ID, IL, IN, IS, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LV, LY, MA, MD, MG, MK, MN, MW, MX, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)
Also published as:
EP1905085US20080100424CN101032016