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1. (WO2007010425) FLUID ANALYSER
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2007/010425 International Application No.: PCT/IB2006/052282
Publication Date: 25.01.2007 International Filing Date: 06.07.2006
IPC:
G01N 27/414 (2006.01) ,G01N 33/497 (2006.01) ,G01N 33/00 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27
Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
26
by investigating electrochemical variables; by using electrolysis or electrophoresis
403
Cells and electrode assemblies
414
Ion-sensitive or chemical field-effect transistors, i.e. ISFETS or CHEMFETS
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
33
Investigating or analysing materials by specific methods not covered by groups G01N1/-G01N31/131
48
Biological material, e.g. blood, urine; Haemocytometers
483
Physical analysis of biological material
497
of gaseous biological material, e.g. breath
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
33
Investigating or analysing materials by specific methods not covered by groups G01N1/-G01N31/131
Applicants:
KONINKLIJKE PHILIPS ELECTRONICS N.V. [NL/NL]; Groenewoudseweg 1 NL-5621 BA Eindhoven, NL (AllExceptUS)
WILLARD, Nicolaas [NL/FR]; FR (UsOnly)
SETAYESH, Sepas [IR/FR]; FR (UsOnly)
LEEUW, Dagobert Michel [NL/FR]; FR (UsOnly)
Inventors:
WILLARD, Nicolaas; FR
SETAYESH, Sepas; FR
LEEUW, Dagobert Michel; FR
Agent:
LANDOUSY, Christian; Société Civile SPID 156 Boulevard Haussmann F-75008 Paris, FR
Priority Data:
05300601.119.07.2005EP
Title (EN) FLUID ANALYSER
(FR) ANALYSEUR DE FLUIDES
Abstract:
(EN) A gas analyser (12) comprises a transistor (1) that has a cavity (7) between its gate (2) and its organic semiconductor (6) based conducting channel. In operation a component from a gas sample introduced into the cavity (7) may absorb onto an exposed absorption sensitive surface portion of the organic semiconductor (6). A detector (13) detects a change in the threshold voltage of the transistor caused by the component absorbing on the exposed surface portion. In response to detecting this change, the detector generates a measurement signal indicative of a concentration of the component in the sample.
(FR) L'invention porte sur un analyseur de gaz (12) qui comprend un transistor (1) comportant une cavité (7) entre sa grille (2) et son canal de conduction à semiconducteur organique (6). En cours de fonctionnement, un composant d'un échantillon de gaz introduit dans la cavité (7) peut être absorbé sur une partie à surface sensible d'absorption exposée du semiconducteur organique (6). Un détecteur (13) détecte un changement dans la tension de seuil du transistor causée par l'absorption du composant par la partie à surface exposée. En réponse à la détection de ce changement, le détecteur produit un signal de mesure indiquant une concentration du composant dans l'échantillon.
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Designated States: AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LV, LY, MA, MD, MG, MK, MN, MW, MX, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)
Also published as:
EP1913371JP2009501927US20080300501CN101223439