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Machine translation
1. (WO2007008961) METHOD AND APPARATUS FOR PARAMETER ADJUSTMENT, TESTING, AND CONFIGURATION
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2007/008961    International Application No.:    PCT/US2006/027014
Publication Date: 18.01.2007 International Filing Date: 12.07.2006
IPC:
G01R 31/08 (2006.01)
Applicants: INTEGRATED DEVICE TECHNOLOGY, INC. [US/US]; 6024 Silver Creek Valley Road, San Jose, CA 95138 (US)
Inventors: HRONIK, Stanley; (US)
Agent: HEIMLICH, Alan; 5952 Dial Way, San Jose, CA 95129 (US)
Priority Data:
60/698,320 12.07.2005 US
11/395,602 31.03.2006 US
Title (EN) METHOD AND APPARATUS FOR PARAMETER ADJUSTMENT, TESTING, AND CONFIGURATION
(FR) PROCEDE ET APPAREIL D'AJUSTEMENT, D'ESSAI ET DE CONFIGURATION DE PARAMETRES
Abstract: front page image
(EN)A method and apparatus for parameter adjustment, testing and configuration pertaining to the testing of devices is disclosed. The method and apparatus allows tuning the interaction of components in a system for best performance, modifying the operation of components in a system, and monitoring changes in parameters which may predict degradation or failure. The method and apparatus may operate at the device, interface or system level. Through serial data chains, systems may be made to perform under selected or imposed operating conditions to allow configuration, testing, measuring or monitoring.
(FR)L'invention concerne un procédé et un appareil destiné à surveiller, ajuster, essayer et/ou configurer des paramètres de dispositifs.
Designated States: AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LV, LY, MA, MD, MG, MK, MN, MW, MX, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)