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1. (WO2007008754) INTEGRATED CIRCUIT TEST SOCKET
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CLAIMS

What is claimed is:

1. An integrated circuit test socket [20] for use with an integrated circuit test board comprising:

a base member [22] configured for attachment to the integrated circuit test board;

a cover member [24] configured for slideable movement between an upper position and a lower position with respect to the base member [20];

a device guide insert [30] positioned within the base member [22] and having an inner dimension to position an integrated circuit to be tested with respect to the integrated circuit test board;

springs [38] positioned between the base member [22] and the cover member [24] and configured to raise the cover member [24] to the upper position when the springs [38] are relaxed and to allow the cover member [24] to assume the lower position when the springs [38] are compressed;

first [26] and second [28] levers configured to move from a closed position to press an integrated circuit to be tested against the integrated circuit test board when the cover member [24] is in the upper position and to retract to an open position when the cover member [24] is in the lower position;

first dowels [88, 92] passing through the first [26] and second [28] levers and through the base member [22]; and

second dowels [80, 84] passing through the first [26] and second [28] levers and through the cover member [24] and configured to move the first [26] and second [28] levers between the closed position when the cover member [24] is in the upper position and the open position when the cover member [24] is in the lower position.

2. The integrated circuit test socket [20] of claim 1 further comprising an elongated slot [62] in each of the first [26] and second [28] levers through which the first dowels [88, 92] are positioned.

3. The integrated circuit test socket [20] of claim 1 wherein the base member [22], cover member [24], and device guide insert [30] are all fabricated from polyetheretherketone.

4. The integrated circuit test socket [20] of claim 1 wherein the base member [22] is configured for attachment to the integrated circuit test board by a plurality of dowel pins [36] passing through the base member [22] and the integrated circuit test board.

5. The integrated circuit test socket [20] of claim 4 wherein the base member [22] has an upper surface [48] and wherein each of the plurality of dowels [36] comprises an upper portion [104] extending above the upper surface [48].

6. The integrated circuit test socket [20] of claim 5 wherein the cover member [24] has a lower surface [46] and wherein the lower surface comprises a plurality of holes [56] positioned to mate with the upper portion

[104] of the plurality of dowel pins [36] upon which the cover member [24] can slideably move.

7. The integrated circuit test socket [20] of claim 1 wherein the base member [22] has a shaped inner cavity [33] and an outer periphery [44] and the device guide insert [30] has a periphery [66] shaped to mate with the shaped inner cavity [33].

8. The integrated circuit test socket [20] of claim 7 wherein the shaped inner cavity [33] is asymmetrical to prevent misorientation of the device guide insert [30].

9. The integrated circuit test socket [20] of claim 7 wherein the cover member [24] has a plurality of fingers [40] extending from body portion to mate with the outer periphery of the base member [22].

10. The integrated circuit test socket of claim 9 wherein the outer periphery [44] of the base member [22] comprises a ridge [52] and at least one of the fingers [40] of the cover member comprises a tab [50] configured to engage the ridge [52] and restrict the slideable movement in the upper position.

11. The integrated circuit test socket [20] of claim 1 wherein the cover member [24] comprises first [94] and second [96] recesses into which the first [26] and second [28] levers locate when the first [26] and second [28] levers are in the open position.

12. An integrated circuit test socket [20] comprising:

a base member [22];

a cover member [24] configured to move vertically between an upper position and a lower position with respect to the base member [22];

springs [38] positioned between the base member [22] and the cover member [24] and configured to bias the cover member [24] in the upper position;

a lever [26, 28] coupled to the base member [22] and to the cover member [24] and configured to pivot to an open position when the cover member [24] is in the lower position and to pivot to a closed position to confine an integrated circuit within the base member [22] when the cover member [24] is in the upper position.

13. The integrated circuit test socket [20] of claim 12 wherein the lever [26, 28] is coupled to the cover member [24] by a first dowel [80, 84] affixed to the cover member [24] and passing through a hole [60] in the lever.

14. The integrated circuit test socket [20] of claim 13 wherein the lever [26, 28] includes a slot [62] and the lever is coupled to the base member [22] by a second dowel [88, 92] affixed to the base member [22] and passing through the slot [62].

15. The integrated circuit test socket [20] of claim 12 wherein the base member [22] has a shaped inner cavity [33] and wherein the integrated circuit test socket [20] further comprises an interchangeable device guide insert [30] removeably positioned within the cavity [33], the device guide insert [30] having an inner shape [70] configured to position an integrated circuit to be tested.

16. The integrated circuit test socket [20] of claim 15 further comprising an interchangeable contact set [32] positioned beneath the interchangeable device guide insert [30].

17. The integrated circuit test socket [20] of claim 12 wherein the base member comprises:

an outer surface [44]; and

a stop ridge [52];

and wherein the cover member [24] comprises a plurality of fingers [40] configured to slide on the outer surface [44] ; and

a tab [50] on one of the plurality of fingers [40] configured to engage the stop ridge [52] and to limit the vertical movement of the cover member [24] .

18. An integrated circuit test socket [20] for use with an integrated circuit test board having a plurality of electrical contacts [32], the integrated circuit test socket comprising:

a base member [22] having an outer surface [44], an upper surface [48], and an inner cavity [33];

a cover member [24] moveable in a vertical direction with respect to the base member [22] between an upper position and a lower position;

a plurality of springs [38] positioned between the base member [22] and the cover member [24] and configured to raise the cover member [24] in the vertical direction;

a first lever [26] and a second lever [28], each having a hole [60] through one extremity and an elongated slot [62] through a middle portion thereof and each configured to pivot between a closed position to contact an integrated circuit to be tested when the cover member [24] is in the upper position and an open position to allow insertion and removal of an integrated circuit when the cover member [24] is in the lower position;

a first dowel [80] passing through the hole [60] in the first lever [26] and a second dowel [84] passing through the hole [60] in the second lever [28], each of the first dowel [80] and second dowels [84] affixed to the cover member [24];

a third dowel [88] passing through the elongated slot [62] in the first lever [26] and a fourth dowel
[92] passing through the elongated slot [62] in the second lever [38], each of the third dowel
[88] and fourth dowel [92] affixed to the base member [22];

an interchangeable device guide insert [30] positioned in the cavity [33] of the base member [22] and having an inner periphery [70] configured to align an integrated circuit to be tested with the plurality of electrical contacts [32]; and

a plurality of pins [36] configured to mount the base member [22] on the integrated circuit test board, each of the plurality of pins passing through the base member [22] and having a shoulder [106] for positioning against the upper surface [48] of the base member [22], the plurality of pins [36] extending above the upper surface [48] and mating with holes [56] formed in the cover member [24].

19. The integrated circuit test socket [20] of claim 18 wherein the cover member [24] comprises an upper surface [46] having an opening therethrough [54] to allow an integrated circuit to be tested to be inserted through the opening [54] and into the device guide insert [30] when the cover member [24] is in the lower position.

20. The integrated circuit test socket [20] of claim 18 wherein the cover member [24] comprises an inner cavity [54] having a first recess [94] into which the first lever [26] pivots and a second recess [96] into which the second lever [28] pivots when the cover member [24] is in the lower position.

21. The integrated circuit test socket [20] of claim 18 wherein the cover member [24] and the base member [22] comprise a stop mechanism [50, 52] to limit the vertical movement of the cover member [24] with respect to the base member [22].