Search International and National Patent Collections
Some content of this application is unavailable at the moment.
If this situation persists, please contact us atFeedback&Contact
1. (WO2007008754) INTEGRATED CIRCUIT TEST SOCKET
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2007/008754 International Application No.: PCT/US2006/026668
Publication Date: 18.01.2007 International Filing Date: 07.07.2006
IPC:
G01R 1/04 (2006.01)
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1
Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02
General constructional details
04
Housings; Supporting members; Arrangements of terminals
Applicants:
SPANSION LLC [US/US]; 915 DEGUIGNE DRIVE MAIL STOP 250 P.O. Box 3453 Sunnyvale, CA 94088-3453, US (AllExceptUS)
MINGVIRIYA, Somboon [JP/US]; US (UsOnly)
Inventors:
MINGVIRIYA, Somboon; US
Agent:
JAIPERSHAD, Rajendra; ONE AMD PLACE MAIL STOP 68 P.O. Box 3453 Sunnyvale, CA 94088-3453, US
Priority Data:
11/180,94312.07.2005US
Title (EN) INTEGRATED CIRCUIT TEST SOCKET
(FR) SUPPORT D'ESSAI DE CIRCUITS INTÉGRÉS
Abstract:
(EN) A test socket is provided for use in testing integrated circuits, especially integrated circuits in BGA packages. The test socket comprises a base member and a cover member configured to move vertically between an upper position and a lower position with respect to the base member. Springs are positioned between the base member and the cover member and configured to bias the cover member in the upper position. A lever is coupled to the base member and to the cover member and is configured to pivot to an open position when the cover member is in the lower position and to pivot to a closed position to confine an integrated circuit within the base member when the cover member is in the upper position.
(FR) L'invention concerne un support d'essai pour mettre à l'essai des circuits intégrés, notamment des circuits intégrés dans des boîtiers BGA. Le support d'essai comprend un élément de base, et un élément couvercle conçu pour effectuer un déplacement vertical entre une position supérieure et une position inférieure par rapport à l'élément de base. Des ressorts placés entre l'élément de base et l'élément couvercle sont conçus pour solliciter l'élément couvercle dans la position supérieure. Un levier couplé à l'élément de base et à l'élément couvercle peut pivoter entre une position ouverte, lorsque l'élément couvercle est dans la position inférieure, et une position fermée dans laquelle le circuit intégré est confiné dans l'élément de base, lorsque l'élément couvercle est dans la position supérieure.
front page image
Designated States: AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LV, LY, MA, MD, MG, MK, MN, MW, MX, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)
Also published as:
KR1020080024227EP1907868JP2009501340US7108535CN101233415