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1. (WO2007004466) ANALYZER
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2007/004466 International Application No.: PCT/JP2006/312783
Publication Date: 11.01.2007 International Filing Date: 27.06.2006
IPC:
G01N 21/27 (2006.01) ,G01N 21/82 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
25
Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
27
using photo-electric detection
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
75
Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
77
by observing the effect on a chemical indicator
82
producing a precipitate or turbidity
Applicants:
シスメックス株式会社 SYSMEX CORPORATION [JP/JP]; 〒6510073 兵庫県神戸市中央区脇浜海岸通1丁目5番1号 Hyogo 5-1, Wakinohama-Kaigandori 1-chome, Chuo-ku, Kobe-shi, Hyogo 6510073, JP (AllExceptUS)
徳永 一敏 TOKUNAGA, Kazutoshi [JP/JP]; JP (UsOnly)
山本 典正 YAMAMOTO, Norimasa [JP/JP]; JP (UsOnly)
Inventors:
徳永 一敏 TOKUNAGA, Kazutoshi; JP
山本 典正 YAMAMOTO, Norimasa; JP
Agent:
宮園 博一 MIYAZONO, Hirokazu; 〒5320011 大阪府大阪市淀川区西中島1丁目9番20号 新中島ビル7階 Osaka Shin-Osaka MT Building I 13-9, Nishinakajima 5-chome Yodogawa-ku, Osaka-shi Osaka 532-0011, JP
Priority Data:
2005-19393601.07.2005JP
Title (EN) ANALYZER
(FR) ANALYSEUR
(JA) 分析装置
Abstract:
(EN) An analyzer is provided with a light irradiation device. The light irradiation device includes a light source, and a rotatable filter section, which has a plurality of optical filters having different light transmission characteristics, and irradiates an analyzing object with light that passed through the optical filters arranged in a path of the light from the light source while the filter section is rotating, by successively switching the optical filters by rotating the filter section. The analyzer is also provided with an analyzing means for analyzing characteristics of the analyzing object, based on optical information obtained from the analyzing object irradiated with the light by the light irradiation device while the filter section is rotating.
(FR) La présente invention concerne un analyser comportant un dispositif d’irradiation de lumière. Le dispositif d’irradiation de lumière comprend une source de lumière, et une section de filtrage rotative, qui comporte une pluralité de filtres optiques présentant des caractéristiques de transmission de lumière différentes, et irradie un objet à analyser avec de la lumière passant à travers les filtres optiques placés dans un passage de la lumière depuis la source de lumière tandis que la section de filtrage tourne, en alternant successivement les filtres optiques en faisant tourner la section de filtrage. L’analyseur comporte également un moyen d’analyse pour analyser les caractéristiques de l’objet à analyser, en fonction des informations optiques obtenues depuis l'objet à analyser irradié avec la lumière par le dispositif d’irradiation de lumière tandis que la section de filtrage tourne.
(JA)  光源と、光透過特性のそれぞれ異なる複数の光学フィルタを有する回転可能なフィルタ部とを含み、フィルタ部を回転させることにより、光源からの光の通路に配置する光学フィルタを順次切り替えながら、フィルタ部が回転している間に光学フィルタを透過した光を分析物に照射する光照射装置と、フィルタ部が回転している間に光照射装置によって光が照射された分析物から得られる光学的情報に基づいて、分析物の特性を解析する解析手段とを備えている。
front page image
Designated States: AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LV, LY, MA, MD, MG, MK, MN, MW, MX, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)
Also published as:
EP1901056JPWO2007004466US20080158552JP2012252014CN101213437IN416/KOLNP/2008