Search International and National Patent Collections
Some content of this application is unavailable at the moment.
If this situation persists, please contact us atFeedback&Contact
1. (WO2007003988) DEVICE AND METHOD FOR COMPENSATING FOR VOLTAGE DROPS
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2007/003988 International Application No.: PCT/IB2005/052230
Publication Date: 11.01.2007 International Filing Date: 05.07.2005
IPC:
G05F 1/56 (2006.01) ,G01R 31/28 (2006.01)
G PHYSICS
05
CONTROLLING; REGULATING
F
SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
1
Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
10
Regulating voltage or current
46
wherein the variable actually regulated by the final control device is dc
56
using semiconductor devices in series with the load as final control devices
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28
Testing of electronic circuits, e.g. by signal tracer
Applicants:
FREESCALE SEMICONDUCTOR, INC. [US/US]; 7700 West Parmer Lane Austin, TX 78729, US (AllExceptUS)
SOFER, Sergey [IL/IL]; IL (UsOnly)
FEFER, Yehim - Haim [IL/IL]; IL (UsOnly)
NEIMAN, Valery [IL/IL]; IL (UsOnly)
Inventors:
SOFER, Sergey; IL
FEFER, Yehim - Haim; IL
NEIMAN, Valery; IL
Priority Data:
Title (EN) DEVICE AND METHOD FOR COMPENSATING FOR VOLTAGE DROPS
(FR) DISPOSITIF ET PROCÉDÉ POUR LA COMPENSATION DE CHUTES DE TENSION
Abstract:
(EN) A device (10) that includes a voltage supply unit (40) and an integrated circuit (20), the device is characterized by including a voltage sampling circuit (30) adapted to sample (110) voltage levels at multiple sampling points within the integrated circuit, to provide multiple sampled voltages, wherein the multiple sampled voltages reflect the voltage drops; and wherein the voltage supply unit (40) is adapted to adjust a supply voltage provided to the integrated circuit (20) in response to at least one sampled voltage. A method (100) for voltage drop.compensation; the method (100) includes providing (110) a supply voltage to an integrated circuit; the method (100) is characterized by sampling (110) voltage levels at multiple sampling points within the integrated circuit, to provide multiple sampled voltages, wherein the multiple sampled voltages reflect the voltage drops; and adjusting (170) a supply voltage provided to the integrated circuit in response to at least one sampled voltage.
(FR) La présente invention a trait à un dispositif (10) comportant une unité de fourniture de tension (40) et un circuit intégré (20). Le dispositif se caractérise en ce qu'il comporte un circuit d'échantillonnage de tension (30) adapté pour l'échantillonnage (110) de niveaux de tension à une pluralité de points d'échantillonnage au sein du circuit intégré, afin de fournir une pluralité de tensions prélevées, la pluralité de tensions prélevées correspondant à des chutes de tension; et l'unité de fourniture de tension (40) étant adapté pour l'ajustement d'une tension d'alimentation fournie au circuit intégré (20) en réponse à au moins une tension prélevée. L'invention a également trait à un procédé (100) pour la compensation de chutes de tension, le procédé (100) comprenant la fourniture (105) d'une tension alimentation à un circuit intégré. Le procédé (100) se caractérise en ce qu'il consiste en l'échantillonnage (110) de niveaux de tension à une pluralité de points d'échantillonnage au sein du circuit intégré, pour fournir une pluralité de tensions prélevées, la pluralité de tensions prélevées correspondant à des chutes de tension; et l'ajustement (170) d'une tension d'alimentation fournie au circuit intégré en réponse à au moins une tension prélevée.
front page image
Designated States: AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KP, KR, KZ, LC, LK, LR, LS, LT, LU, LV, MA, MD, MG, MK, MN, MW, MX, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RU, SC, SD, SE, SG, SK, SL, SM, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, YU, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)
Also published as:
EP2226641EP1902348US20080224684