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1. (WO2007002182) IMPROVED SYSTEMS AND METHODS FOR CHIRAL DETECTION AND ANALYSIS
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2007/002182 International Application No.: PCT/US2006/024123
Publication Date: 04.01.2007 International Filing Date: 21.06.2006
IPC:
G01N 21/21 (2006.01) ,G01N 21/05 (2006.01) ,G01J 4/04 (2006.01) ,G01M 11/04 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
21
Polarisation-affecting properties
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
01
Arrangements or apparatus for facilitating the optical investigation
03
Cuvette constructions
05
Flow-through cuvettes
G PHYSICS
01
MEASURING; TESTING
J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
4
Measuring polarisation of light
04
Polarimeters using electric detection means
G PHYSICS
01
MEASURING; TESTING
M
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
11
Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
02
Testing of optical properties
04
Optical benches
Applicants:
STHENO CORPORATION [US/US]; 311 Ferst Drive, N.W. Suite L 1362 Atlanta, GA 30332, US (AllExceptUS)
GIBBS, Phillip R. [US/US]; US (UsOnly)
WADE, John [US/US]; US (UsOnly)
Inventors:
GIBBS, Phillip R.; US
WADE, John; US
Agent:
GARRETT, Arthur S.; FINNEGAN, HENDERSON, FARABOW, GARRETT & DUNNER, LLP 901 New York Avenue, Nw Washington, District Of Columbia 20001-4181, US
Priority Data:
60/692,23021.06.2005US
Title (EN) IMPROVED SYSTEMS AND METHODS FOR CHIRAL DETECTION AND ANALYSIS
(FR) SYSTEMES ET PROCEDES AMELIORES DE DETECTION ET D'ANALYSE CHIRALES
Abstract:
(EN) Relating to chiral detection systems, various improvements are disclosed including an improved apparatus for detecting a chiral property of a sample. It has a rugged and stable optical rail that operates as a heat sink to the systems' elements and comprises a captive guide structure (300) of heat conductive material having an elevated top platform (302) and a dove tailed lip (305) on the sides. The elevated top platform (302) has a substantial width in comparison to a height of the elevated top platform (302). The apparatus further includes a wide base portion (304) of heat conductive material supportive of the captive guide structure (300). The base (304) has a width that is at least twice the width of the elevated top platform (302) and a substantial thickness relative to the captive guide structure (300). Multiple system elements can be securely mounted on the captive guide structure (300) with some elements being in thermal contact with the elevated top platform (302).
(FR) La présente invention concerne des systèmes de détection chirale et diverses améliorations comprenant un appareil amélioré permettant de détecter une propriété chirale dans un échantillon. Il possède un rail optique irrégulier et stable qui fonctionne comme un dissipateur de chaleur pour les éléments du système et comprend une structure de guidage captif (300) du matériau thermoconducteur possédant une plate-forme supérieure élevée (302) et une lèvre en queue d'aronde (305) sur les côtés. La plate-forme supérieure élevée (302) possède une largeur importante en comparaison de la hauteur de cette plate-forme supérieure élevée (302). Cet appareil comprend aussi une grande partie base (304) de matériau thermoconducteur supportant la structure de guidage captif (300). Cette base (304) possède une largeur qui est au moins le double de celle de la plate-forme supérieure élevée (302) et une épaisseur importante par apport à la structure de guidage captif (300). De multiples éléments du système peuvent être fixés sur la structure de guidage captif (300) avec quelques éléments en contact thermique avec la plate-forme supérieure élevée (302).
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Designated States: AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LV, LY, MA, MD, MG, MK, MN, MW, MX, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)