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Machine translation
1. (WO2006127912) ECCENTRIC OFFSET KELVIN PROBE
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2006/127912    International Application No.:    PCT/US2006/020266
Publication Date: 30.11.2006 International Filing Date: 25.05.2006
IPC:
G01R 31/308 (2006.01)
Applicants: FARRIS, Jason, W. [US/US]; (US).
INTERCONNECT DEVICES, INC. [US/US]; 5101 Richland Avenue, Kansas City, KS 66106 (US) (For All Designated States Except US).
THURSTON, William, E. [US/US]; (US)
Inventors: FARRIS, Jason, W.; (US).
THURSTON, William, E.; (US)
Agent: KERNELL, James, J.; Chase Law Firm, L.C., 4400 College Boulevard, Suite 130, Overland Park, KS 66211 (US)
Priority Data:
11/137,187 25.05.2005 US
Title (EN) ECCENTRIC OFFSET KELVIN PROBE
(FR) SONDE DE KELVIN A DECALAGE EXCENTRIQUE
Abstract: front page image
(EN)An eccentric offset Kelvin probe with a beveled contact tip radially offset from the longitudinal axis of the probe which provides a reduced tip spacing between adjacent pairs of probes.
(FR)Sonde de Kelvin à décalage excentrique avec un embout de contact biseauté décalé radialement depuis l’axe longitudinal de la sonde qui met à disposition un espacement d’embout réduit entre des paires adjacentes de sondes.
Designated States: AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LC, LK, LR, LS, LT, LU, LV, LY, MA, MD, MG, MK, MN, MW, MX, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RU, SC, SD, SE, SG, SK, SL, SM, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, YU, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)