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1. WO2006095441 - PROBE FOR ENERGIZATION TEST AND ELECTRIC CONNECTION DEVICE USING THE SAME

Publication Number WO/2006/095441
Publication Date 14.09.2006
International Application No. PCT/JP2005/004382
International Filing Date 07.03.2005
IPC
G01R 1/067 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
CPC
G01R 1/06727
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
06716Elastic
06727Cantilever beams
G01R 1/06738
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
06733Geometry aspects
06738related to tip portion
Applicants
  • 株式会社日本マイクロニクス KABUSHIKI KAISHA NIHON MICRONICS [JP]/[JP] (AllExceptUS)
  • 国吉 伸治 KUNIYOSHI, Shinji [JP]/[JP] (UsOnly)
  • 平川 秀樹 HIRAKAWA, Hideki [JP]/[JP] (UsOnly)
  • 相馬 亮 SOMA, Akira [JP]/[JP] (UsOnly)
  • 林崎 孝幸 HAYASHIZAKI, Takayuki [JP]/[JP] (UsOnly)
Inventors
  • 国吉 伸治 KUNIYOSHI, Shinji
  • 平川 秀樹 HIRAKAWA, Hideki
  • 相馬 亮 SOMA, Akira
  • 林崎 孝幸 HAYASHIZAKI, Takayuki
Agents
  • 松永 宣行 MATSUNAGA, Nobuyuki
Priority Data
Publication Language Japanese (JA)
Filing Language Japanese (JA)
Designated States
Title
(EN) PROBE FOR ENERGIZATION TEST AND ELECTRIC CONNECTION DEVICE USING THE SAME
(FR) SONDE POUR TEST D'ACTIVATION ET DISPOSITIF DE CONNEXION ELECTRIQUE L'UTILISANT
(JA) 通電試験用プローブ及びこれを用いた電気的接続装置
Abstract
(EN)
A probe, comprising an arm area extending in the longitudinal direction and a needle tip area extending from the tip part of the arm area downward. The needle tip area comprises a pedestal part integrally continued with the tip side lower edge part of the arm area and having a lower surface tilted relative to a virtual axis extending in the vertical direction and a contact part projected from the lower surface of the pedestal part and having a needle tip perpendicular to the virtual axis. Thus, the position of the needle tip can be accurately determined.
(FR)
L'invention concerne une sonde comportant une zone de bras s'étendant dans la direction longitudinale et une zone de pointe d'aiguille s'étendant vers le bas à partir de la partie terminale de la zone de bras. La zone de pointe d'aiguille comporte une partie de socle intégrée dans le prolongement du bord inférieur de l'extrémité de la zone de bras et présentant une surface inférieure inclinée par rapport à un axe imaginaire s'étendant dans la direction verticale et une partie de contact faisant saillie à partir de la surface inférieure de la partie de socle et dotée d'une pointe d'aiguille perpendiculaire à l'axe imaginaire. Ainsi, la position de la pointe d'aiguille peut être déterminée avec précision.
(JA)
 プローブは、前後方向へ伸びるアーム領域と、該アーム領域の先端部から下方へ伸びる針先領域とを含む。針先領域は、アーム領域の先端側の下縁部に一体的に続く台座部であって上下方向へ伸びる仮想的な軸線に対し傾斜した下面を有する台座部と、該台座部の下面から突出する接触部であって仮想的な軸線に直角の針先を有する接触部とを備えている。これにより、針先の位置を正確に決定可能になる。
Also published as
EP5720653
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