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1. (WO2006085247) DOSE RATE CONTROL IN AN X-RAY SYSTEM
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2006/085247    International Application No.:    PCT/IB2006/050354
Publication Date: 17.08.2006 International Filing Date: 02.02.2006
IPC:
A61B 6/00 (2006.01), H05G 1/32 (2006.01)
Applicants: KONINKLIJKE PHILIPS ELECTRONICS N.V. [NL/NL]; Groenewoudseweg 1, NL-5621 BA Eindhoven (NL) (AE, AG, AL, AM, AT, AU, AZ, BA, BB, BE, BF, BG, BJ, BR, BW, BY, BZ, CA, CF, CG, CH, CI, CM, CN, CO, CR, CU, CY, CZ, DK, DM, DZ, EC, EE, EG, ES, FI, FR, GA, GB, GD, GE, GH, GM, GN, GQ, GR, GW, HR, HU, ID, IE, IL, IN, IS, IT, JP, KE, KG, KM, KN, KP, KR, KZ, LC, LK, LR, LS, LT, LU, LV, LY, MA, MC, MD, MG, MK, ML, MN, MR, MW, MX, MZ, NA, NE, NG, NI, NL, NO, NZ, OM, PG, PH, PL, PT, RO, RU, SC, SD, SE, SG, SI, SK, SL, SM, SN, SY, SZ, TD, TG, TJ, TM, TN, TR, TT, TZ, UA, UG, UZ, VC, VN, YU, ZA, ZM, ZW only).
PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH [DE/DE]; Steindamm 94, 20099 Hamburg (DE) (DE only).
HESS, Robert [DE/DE]; (NL) (For US Only).
STEINER, Reinhard [DE/DE]; (NL) (For US Only)
Inventors: HESS, Robert; (NL).
STEINER, Reinhard; (NL)
Agent: SCHOUTEN, Marcus, M.; Prof. Holstlaan 6, NL-5656 AA Eindhoven (NL)
Priority Data:
05101011.4 11.02.2005 EP
Title (EN) DOSE RATE CONTROL IN AN X-RAY SYSTEM
(FR) COMMANDE DE DEBIT DE DOSE DANS UN SYSTEME DE RAYONS X
Abstract: front page image
(EN)A controller for controlling the dose rate (exposure kV tube voltage) of an X- ray system, in which the actual dose rate is measured and compared with an optimal dose rate, and the resultant difference value is fed to a module (20) (e.g. a PID module) which is arranged to adjust the dose rate (by adjusting the exposure kV voltage) so as to minimise the difference value. No preset parameters are required to be entered prior to exposure.
(FR)La présente invention concerne un contrôleur destiné à commander le débit de dose d'un système de rayons X (tension de tube en kV d'exposition), dans lequel le débit de dose réelle est mesuré et comparé avec un débit de dose optimale et, la valeur de différence résultante est alimentée dans un module (20) (par exemple un module PID) qui est agencé de façon à régler le débit de dose (par le réglage de la tension en kV d'exposition) afin de minimiser cette valeur de différence. Aucune entrée de paramètre de préréglage n'est requis avant l'exposition.
Designated States: AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LC, LK, LR, LS, LT, LU, LV, LY, MA, MD, MG, MK, MN, MW, MX, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RU, SC, SD, SE, SG, SK, SL, SM, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, YU, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)