Processing

Please wait...

Settings

Settings

Goto Application

1. WO2006052105 - METHOD FOR ADHERING NANOSTRUCTURES TO END OF PROBE OF MICROSCOPE AND MICROSCOPE HAVING PROBE MADE BY THE SAME METHOD

Publication Number WO/2006/052105
Publication Date 18.05.2006
International Application No. PCT/KR2005/003832
International Filing Date 11.11.2005
Chapter 2 Demand Filed 24.04.2006
IPC
G01Q 10/00 2010.1
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
10Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
G01Q 70/16 2010.1
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
70General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/196
16Probe manufacture
G01Q 70/18 2010.1
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
70General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/196
16Probe manufacture
18Functionalisation
CPC
G01Q 70/18
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
70General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
16Probe manufacture
18Functionalisation
Applicants
  • SEOUL NATIONAL UNIVERSITY INDUSTRY FOUNDATION [KR]/[KR] (AllExceptUS)
  • HONG, Seung-Hun [KR]/[KR] (UsOnly)
  • KIM, Dai-Sik [KR]/[KR] (UsOnly)
  • MYUNG, Sung [KR]/[KR] (UsOnly)
  • CHO, Na-Rae [KR]/[KR] (UsOnly)
  • KIM, Jin-Eun [KR]/[KR] (UsOnly)
Inventors
  • HONG, Seung-Hun
  • KIM, Dai-Sik
  • MYUNG, Sung
  • CHO, Na-Rae
  • KIM, Jin-Eun
Agents
  • SHINSUNG PATENT FIRM
Priority Data
10-2004-009259812.11.2004KR
10-2005-010697609.11.2005KR
Publication Language English (en)
Filing Language Korean (KO)
Designated States
Title
(EN) METHOD FOR ADHERING NANOSTRUCTURES TO END OF PROBE OF MICROSCOPE AND MICROSCOPE HAVING PROBE MADE BY THE SAME METHOD
(FR) PROCEDE DE COLLAGE DE NANOSTRUCTURES A L'EXTREMITE D'UNE SONDE DE MICROSCOPE ET MICROSCOPE DOTE D'UNE SONDE OBTENUE PAR CE PROCEDE
Abstract
(EN) There is provided a method for selectively adsorbing nano-structures on the end of the probe of a scanning probe microscope. The method includes the steps of : forming the adsorbing prevention coating layer on the probe surface of the scanning probe microscope; removing the adsorbing prevention coating layer formed on the end of the probe; and adsorbing nano-structures on the end of the probe at which the adsorbing prevention coating layer is removed, in the solution or the gas containing nano-structures.
(FR) L'invention concerne un procédé permettant d'adsorber de manière sélective des nanostructures à l'extrémité de la sonde d'un microscope à sonde de balayage. Le procédé consiste notamment à former la couche de revêtement anti-adsorption sur la surface de la sonde du microscope à sonde de balayage; à enlever ladite couche formée sur l'extrémité de la sonde; et à adsorber les nanostructures sur l'extrémité de la sonde dont on a évacué ladite couche, dans la solution ou le gaz contenant des nanostructures.
Related patent documents
Latest bibliographic data on file with the International Bureau