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Pub. No.: WO/2006/013320 International Application No.: PCT/GB2005/002801
Publication Date: 09.02.2006 International Filing Date: 18.07.2005
Chapter 2 Demand Filed: 27.04.2006
IPC:
G01N 21/57 (2006.01) ,G01J 3/52 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
55
Specular reflectivity
57
Measuring gloss
G PHYSICS
01
MEASURING; TESTING
J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
3
Spectrometry; Spectrophotometry; Monochromators; Measuring colours
46
Measurement of colour; Colour measuring devices, e.g. colorimeters
52
using colour charts
Applicants: STEVENSON, Alexander[GB/GB]; GB (UsOnly)
DIVER, Guy, Roper[GB/GB]; GB (UsOnly)
BUTT, Zahid, Pervaz[GB/GB]; GB (UsOnly)
INTERCOLOR LIMITED[GB/GB]; Queensbridge Industrial Park 795 London Road West Thurrock Essex RM20 3LH, GB (AllExceptUS)
Inventors: STEVENSON, Alexander; GB
DIVER, Guy, Roper; GB
BUTT, Zahid, Pervaz; GB
Agent: NUNNEY, Ronald, Frederick, Adolphe; HLBB Shaw Merlin House, Falconry Court Baker's Lane Epping Essex CM16 5DQ, GB
Priority Data:
0417247.403.08.2004GB
Title (EN) A METHOD AND APPARATUS FOR MEASURING LUSTRE
(FR) METHODE ET APPAREIL POUR MESURER UN DEGRE D'ECLAT
Abstract:
(EN) A method of measuring the lustre of a surface having a metallic appearance comprises a) determining the intensity of the various wavelengths of light reflected from an area of the surface; b) producing from the reflected light measurements a set of CIE L*a*b* coordinates for the surface with the specular content of the reflected light included and a set of CIE L*a*b* coordinatess for the surface with the specular content of the reflected light excluded; c) converting each set of CIE L*a*b* coordinates into its tristimulus values; d) converting the tristimulus values for each set of CIE L*a*b* values into spectral reflectance data for each set of tristimulus values; and, e) converting the spectral reflectance data for each set of tristimulus values into a lustre measurement for the surface which is a function of the difference between the sum of spectral reflectance data for the set wherein specular content is included and the sum of spectral reflectance data for the set wherein specular content is excluded.
(FR) L'invention concerne une méthode de mesure de l'éclat d'une surface présentant un aspect métallique. Cette méthode consiste à: a) déterminer l'intensité des longueurs d'onde variées de la lumière réfléchie à partir d'une zone de la surface; b) produire, à partir des mesures de la lumière réfléchie, un ensemble de coordonnées CIE L*a*b* pour la surface, excluant le contenu spéculaire de la lumière réfléchie; c) convertir chaque ensemble de coordonnées CIE L*a*b* en composantes trichromatiques; d) convertir ces valeurs trichromatiques, pour chaque ensemble de valeurs CIE L*a*b* en données de réflectance spectrale pour chaque ensemble de valeurs trichromatiques; et, e) convertir les données de réflectance spectrale pour chaque ensemble de valeurs trichromatiques en une mesure d'éclat pour la surface, cette mesure étant une fonction de la différence entre la somme des données de reflectance spectrale de l'ensemble dans lequel le contenu spéculaire est inclus et la somme des données de réflectance spectrale de l'ensemble dans lequel le contenu spéculaire est exclu.
front page image
Designated States: AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KP, KR, KZ, LC, LK, LR, LS, LT, LU, LV, MA, MD, MG, MK, MN, MW, MX, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RU, SC, SD, SE, SG, SK, SL, SM, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, YU, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (EPO) (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)