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1. (WO2005111560) A METHOD AND A SYSTEM FOR THE ASSESSMENT OF SAMPLES
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2005/111560    International Application No.:    PCT/DK2005/000325
Publication Date: 24.11.2005 International Filing Date: 17.05.2005
IPC:
G01J 3/453 (2006.01), G01N 21/35 (2006.01)
Applicants: CHEMOMETEC A/S [DK/DK]; Gydevang 43, DK-3450 Allerød (DK) (For All Designated States Except US).
ARNVIDARSON, Börkur [DK/DK]; (DK) (For US Only).
LARSEN, Hans [DK/DK]; (DK) (For US Only)
Inventors: ARNVIDARSON, Börkur; (DK).
LARSEN, Hans; (DK)
Agent: HØIBERG A/S; St. Kongengsgade 59A, DK-1264 Copenhagen K (DK)
Priority Data:
PA 2004 00773 14.05.2004 DK
Title (EN) A METHOD AND A SYSTEM FOR THE ASSESSMENT OF SAMPLES
(FR) PROCEDE ET SYSTEME D'EVALUATION D'ECHANTILLONS
Abstract: front page image
(EN)The present invention offers an alternative strategy for the correlation of interference information to chemical and/or physical properties of a sample. This strategy can be implemented in a method and a system, which offer substantial technical and commercial advantages over state of the art techniques based on interference spectroscopy. The invention further provides a method for standardizing an interferometer, as well as a method and a system using the standardized interferometer.
(FR)L'invention concerne une stratégie permettant de corréler des données d'interférence avec les propriétés chimiques et/ou physiques d'un échantillon. Cette stratégie peut être mise en oeuvre dans un procédé et un système qui présentent des avantages techniques et commerciaux substantiels par rapport aux techniques actuelles utilisant la spectroscopie interférentielle. L'invention concerne de plus un procédé de standardisation d'un interféromètre, ainsi qu'un procédé et un système utilisant un interféromètre standardisé.
Designated States: AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KP, KR, KZ, LC, LK, LR, LS, LT, LU, LV, MA, MD, MG, MK, MN, MW, MX, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RU, SC, SD, SE, SG, SK, SL, SM, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, YU, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LT, LU, MC, NL, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)