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1. (WO2005106439) FLUORESCENT X-RAY ANALYSIS METHOD AND EQUIPMENT

Pub. No.:    WO/2005/106439    International Application No.:    PCT/JP2005/007774
Publication Date: Nov 10, 2005 International Filing Date: Apr 25, 2005
IPC: G01N 23/223
Applicants: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
松下電器産業株式会社
IWAMOTO, Hiroshi
岩本 洋
TANI, Yoshiyuki
谷 美幸
HISAZUMI, Takao
久角 隆雄
IWATA, Yukihiro
岩田 進裕
SAKAGUCHI, Etsuyoshi
坂口 悦美
Inventors: IWAMOTO, Hiroshi
岩本 洋
TANI, Yoshiyuki
谷 美幸
HISAZUMI, Takao
久角 隆雄
IWATA, Yukihiro
岩田 進裕
SAKAGUCHI, Etsuyoshi
坂口 悦美
Title: FLUORESCENT X-RAY ANALYSIS METHOD AND EQUIPMENT
Abstract:
In a fluorescent X-ray analysis method, a sample (1) is set on a sample stage (2) on an upper side of an X-ray irradiation chamber (7) and a sample cover (6) is closed from the upper part of the sample (1) to surround the sample (1), and then, a lower plane of the sample (1) is irradiated with X-ray for analysis. When the sample (1) is set on the sample stage (2) and the sample cover (6) is closed, a cover detecting means (8) detects that the sample cover (6) is closed and X-ray is automatically projected from an X-ray source (3) to start analysis.