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1. (WO2005103649) METHOD OF ASSESSING THE RISK OF WHISKERS APPEARING ON THE SURFACE OF A METALLIC DEPOSIT
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2005/103649    International Application No.:    PCT/FR2005/000901
Publication Date: 03.11.2005 International Filing Date: 14.04.2005
IPC:
G01N 17/02 (2006.01), G01N 27/02 (2006.01), G01R 31/36 (2006.01), C25D 21/00 (2006.01)
Applicants: MICROPULSE PLATING CONCEPTS [FR/FR]; 1, Avenue Leclerc, F-69007 Lyon (FR) (For All Designated States Except US).
MENTION, David [FR/FR]; (FR) (For US Only).
MENARD, Stéphane [FR/FR]; (FR) (For US Only)
Inventors: MENTION, David; (FR).
MENARD, Stéphane; (FR)
Agent: LE CACHEUX, Samuel; Cabinet Beau De Lomenie, 51, Avenue Jean Jaurès, B.P. 7073, F-69301 Lyon Cédex 07 (FR)
Priority Data:
0403937 15.04.2004 FR
Title (EN) METHOD OF ASSESSING THE RISK OF WHISKERS APPEARING ON THE SURFACE OF A METALLIC DEPOSIT
(FR) PROCEDE D'EVALUATION DU RISQUE D'APPARITION DE WHISKERS A LA SURFACE D'UN DEPOT METALLIQUE
Abstract: front page image
(EN)The invention relates to a method of assessing the risk of whiskers appearing on the surface of a metallic deposit, a pure metal deposit or an alloy deposit on a substrate, using a measurement of the electrochemical impedance of the metallic deposit.
(FR)L'invention concerne un procédé d'évaluation du risque d'apparition de whiskers à la surface d'un dépôt métallique, d'un métal pur ou d'un alliage, sur un substrat, utilisant une mesure de l'impédance électrochimique du dépôt métallique.
Designated States: AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KP, KR, KZ, LC, LK, LR, LS, LT, LU, LV, MA, MD, MG, MK, MN, MW, MX, MZ, NA, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RU, SC, SD, SE, SG, SK, SL, SM, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, YU, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LT, LU, MC, NL, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: French (FR)
Filing Language: French (FR)