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1. (WO2005069280) METHOD FOR DETERMINING SPHERICAL ABERRATION
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2005/069280    International Application No.:    PCT/EP2004/012593
Publication Date: 28.07.2005 International Filing Date: 06.11.2004
IPC:
G02B 27/00 (2006.01), G02B 27/40 (2006.01), G02B 7/00 (2006.01), G11B 7/135 (2012.01), G11B 7/13 (2012.01)
Applicants: THOMSON LICENSING [FR/FR]; 46 Quai A. le Gallo, F-92100 Boulogne-Billancourt (FR) (For All Designated States Except US).
KNITTEL, Joachim [DE/DE]; (DE) (For US Only)
Inventors: KNITTEL, Joachim; (DE)
Agent: THIES, Stephan; Deutsche Thomson-Brandt GmbH, European Patent Operations, Karl-Wiechert-Allee 74, 30625 Hannover (DE)
Priority Data:
04000258.6 08.01.2004 EP
Title (EN) METHOD FOR DETERMINING SPHERICAL ABERRATION
(FR) PROCEDE DE DETERMINATION DE L'ABERRATION SPHERIQUE
Abstract: front page image
(EN)The present invention relates to a method and a device for determining spherical aberration occurring during reading from and/or writing to optical recording media. According to the invention, a method for determining spherical aberration includes the steps of: splitting the light beam (2) into at least two partial light beams (20, 21, 22, 23, 24, 25); focusing the partial light beams (20, 21, 22, 23, 24, 25) onto respective detectors (11, 12, 13, 16, 17, 18), whereby at least one signal (A, B, C, D) generated by the detectors (12, 13, 16, 17, 18) depends on the positions of the respective partial light beam (21, 22, 23, 24, 25); and determining the spherical aberration using the signals (A, B, C, D) generated by the detectors (12, 13, 16, 17, 18).
(FR)L'invention concerne un procédé et un dispositif de détermination de l'aberration sphérique qui se produit lors des opérations de lecture et/ou d'enregistrement sur un support optique. Selon l'invention, un procédé de détermination de l'aberration sphérique consiste à: diviser le faisceau lumineux (2) en au moins deux faisceaux lumineux partiels (20, 21, 22, 23, 24, 25); concentrer les faisceaux lumineux partiels (20, 21, 22, 23, 24, 25) sur des détecteurs respectifs (11, 12, 13, 16, 17, 18), de manière à ce que au moins un signal (A, B, C, D) émis par les détecteurs (12, 13, 16, 17, 18) dépende des positions du faisceau lumineux partiel respectif (21, 22, 23, 24, 25); et enfin, déterminer l'aberration sphérique au moyen des signaux (A, B, C, D) émis par les détecteurs (12, 13, 16, 17, 18).
Designated States: AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, HR, HU, ID, IL, IN, IS, JP, KE, KG, KP, KR, KZ, LC, LK, LR, LS, LT, LU, LV, MA, MD, MG, MK, MN, MW, MX, MZ, NA, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RU, SC, SD, SE, SG, SK, SL, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, YU, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LU, MC, NL, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)