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Machine translation
1. (WO2005038424) OPTICAL DEVICE INSPECTION SYSTEM AND METHOD USING A LARGE DEPTH OF FIELD
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2005/038424    International Application No.:    PCT/US2004/033798
Publication Date: 28.04.2005 International Filing Date: 13.10.2004
Chapter 2 Demand Filed:    15.07.2005    
IPC:
G01M 11/02 (2006.01)
Applicants: BAUSCH & LOMB INCORPORATED [US/US]; One Bausch & Lomb Place, Rochester, NY 14604 (US) (For All Designated States Except US).
BERGENDAHL, Marc [US/US]; (US) (For US Only).
LEWISON, David [US/US]; (US) (For US Only).
PUFFER, Raymond, H., Jr. [US/US]; (US) (For US Only)
Inventors: BERGENDAHL, Marc; (US).
LEWISON, David; (US).
PUFFER, Raymond, H., Jr.; (US)
Agent: MCGUIRE, Katherine; Bausch & Lomb Incorporated, One Bausch & Lomb Place, Rochester, NY 14604 (US)
Priority Data:
10/685,326 14.10.2003 US
Title (EN) OPTICAL DEVICE INSPECTION SYSTEM AND METHOD USING A LARGE DEPTH OF FIELD
(FR) ACCENTUATION DE LA PROFONDEUR DE CHAMP D'UN COMPARATEUR OPTIQUE
Abstract: front page image
(EN)An optical device inspection system and method employing a narrow aperture on a magnifying objective lens in order to reduce the circle of confusion and increase the depth of field. The smaller aperture resulting in an increase in depth of field allows for simultaneous focus for all portions of objects being inspected. An arc lamp with an elliptical reflector in combination with a condenser lens focuses a more intense beam of light through the objective lens, thereby providing sufficient brightness without sacrificing any depth of field.
(FR)L'invention concerne un système de contrôle d'un dispositif optique et un procédé utilisant une ouverture étroite ménagée sur un objectif grossissant pour réduire le cercle de confusion et accentuer la profondeur de champ. L'ouverture plus petite résultant de l'accentuation de la profondeur de champ permet d'effectuer une mise au point simultanée pour toutes les parties d'objets soumises au contrôle. Une lampe à arc comprenant un réflecteur elliptique combiné à une lentille de champ collectif focalise un faisceau lumineux plus intense à travers l'objectif apportant ainsi une luminosité suffisante sans rien perdre de la profondeur de champ.
Designated States: AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, HR, HU, ID, IL, IN, IS, JP, KE, KG, KP, KR, KZ, LC, LK, LR, LS, LT, LU, LV, MA, MD, MG, MK, MN, MW, MX, MZ, NA, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RU, SC, SD, SE, SG, SK, SL, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, YU, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IT, LU, MC, NL, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)