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Machine translation
1. (WO2004102580) MEMORY WITH UNIFORM READ AND VERIFICATION THRESHOLD
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2004/102580    International Application No.:    PCT/US2004/014248
Publication Date: 25.11.2004 International Filing Date: 07.05.2004
Chapter 2 Demand Filed:    08.12.2004    
IPC:
G11C 16/04 (2006.01), G11C 16/08 (2006.01)
Applicants: MICRON TECHNOLOGY, INC. [US/US]; 8000 South Federal Way, Boise, ID 83716 (US) (For All Designated States Except US).
ROOHPARVAR, Frankie [US/US]; (US) (For US Only)
Inventors: ROOHPARVAR, Frankie; (US)
Agent: BOLVIN, Kenneth, W.; Leffert Jay & Polglaze, P.A., P.O. Box 581009, Minneapolis, MN 55458-1009 (US)
Priority Data:
10/431,862 08.05.2003 US
Title (EN) MEMORY WITH UNIFORM READ AND VERIFICATION THRESHOLD
(FR) MEMOIRE A SEUIL DE LECTURE ET DE VERIFICATION HOMOGENE
Abstract: front page image
(EN)A plurality of cells in a flash memory device are coupled together in a series configuration, as in a NAND flash memory. A position of a first accessed cell is determined with reference to a ground potential in the flash memory device. A first word line signal is coupled to the first accessed cell. The first word line signal voltage level is adjusted in response to the position of the first accessed cell in its series of cells.
(FR)Plusieurs cellules d'un dispositif de mémoire flash sont couplées les unes aux autres selon une configuration en série, comme dans une mémoire flash NONET. Un emplacement d'une première cellule accédée est déterminée par rapport à un potentiel à la terre dans le dispositif de mémoire flash. Un premier signal de canal mot est couplé à la première cellule accédée. Le niveau de tension du premier signal de canal mot est réglé en réponse à l'emplacement de la première cellule accédée dans sa série de cellules.
Designated States: AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, HR, HU, ID, IL, IN, IS, JP, KE, KG, KP, KR, KZ, LC, LK, LR, LS, LT, LU, LV, MA, MD, MG, MK, MN, MW, MX, MZ, NA, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RU, SC, SD, SE, SG, SK, SL, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, YU, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IT, LU, MC, NL, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)