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Machine translation
1. (WO2004036260) BIREFRINGENCE MEASUREMENT OF LARGE-FORMAT SAMPLES
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2004/036260    International Application No.:    PCT/US2003/032120
Publication Date: 29.04.2004 International Filing Date: 08.10.2003
IPC:
G01N 21/23 (2006.01), G01N 21/95 (2006.01)
Applicants: HINDS INSTRUMENTS, INC. [US/US]; 3175 N.W. Alocleck Drive, Hillsboro, OR 97124 (US) (For All Designated States Except US).
KAPLAN, Andrew, D. [US/US]; (US) (For US Only).
MANSFIELD, James, C. [US/US]; (US) (For US Only).
MARK, Douglas, C. [US/US]; (US) (For US Only)
Inventors: KAPLAN, Andrew, D.; (US).
MANSFIELD, James, C.; (US).
MARK, Douglas, C.; (US)
Agent: HUGHEY, Patrick, W.; Ipsolon LLP, 805 SW Broadway, #2740, Portland, OR 97205 (US)
Priority Data:
60/419,685 16.10.2002 US
10/359,529 05.02.2003 US
Title (EN) BIREFRINGENCE MEASUREMENT OF LARGE-FORMAT SAMPLES
(FR) MESURE DE BIREFRINGENCE D'ECHANTILLONS GRAND FORMAT
Abstract: front page image
(EN)The disclosure is directed to systems and methods for precisely measuring birefringence properties of large-format samples of optical elements. A gantry-like configuration is employed for precise movement of birefringence measurement system components relative to the sample. There is also provided an effective large-format sample holder that adequately supports the sample to prevent induced birefringence therein while still presenting a large area of the sample to the unhindered passage of light.
(FR)L'invention concerne des systèmes et des procédés permettant de mesurer précisément des propriétés de biréfringence d'échantillons grand format d'éléments optiques. Une configuration de type pont roulant est employée pour un déplacement précis de composants du système de mesure de biréfringence par rapport à l'échantillon. L'invention concerne également un dispositif de support d'échantillons grand format efficace permettant un support adéquat de l'échantillon pour éviter une biréfringence induite dans l'échantillon, tout en présentant une grande zone de l'échantillon au passage non obstrué de la lumière.
Designated States: AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DZ, EC, EE, ES, FI, GB, GD, GE, GH, GM, HR, HU, ID, IL, IN, IS, JP, KE, KG, KP, KR, KZ, LC, LK, LR, LS, LT, LU, LV, MA, MD, MG, MK, MN, MW, MX, MZ, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RU, SC, SD, SE, SG, SK, SL, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, YU, ZA, ZM, ZW.
African Regional Intellectual Property Organization (GH, GM, KE, LS, MW, MZ, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IT, LU, MC, NL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)