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1. WO2004010549 - ON-LINE RECHARACTERIZATION OF LASER DIODES

Publication Number WO/2004/010549
Publication Date 29.01.2004
International Application No. PCT/IL2003/000594
International Filing Date 21.07.2003
IPC
H01S 5/00 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
5Semiconductor lasers
H01S 5/06 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
5Semiconductor lasers
06Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
H01S 5/0687 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
5Semiconductor lasers
06Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
068Stabilisation of laser output parameters
0683by monitoring the optical output parameters
0687Stabilising the frequency of the laser
CPC
H01S 5/0014
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
5Semiconductor lasers
0014Measuring characteristics or properties thereof
H01S 5/0617
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
5Semiconductor lasers
06Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
0617using memorised or pre-programmed laser characteristics
H01S 5/0687
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
5Semiconductor lasers
06Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
068Stabilisation of laser output parameters
0683by monitoring the optical output parameters
0687Stabilising the frequency of the laser
Applicants
  • XLIGHT PHOTONICS INC., [US]/[US] (AllExceptUS)
  • BUIMOVICH, Efraim [IL]/[IL] (UsOnly)
  • SADOT, Dan [IL]/[IL] (UsOnly)
Inventors
  • BUIMOVICH, Efraim
  • SADOT, Dan
Priority Data
150 83121.07.2002IL
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) ON-LINE RECHARACTERIZATION OF LASER DIODES
(FR) NOUVELLE CARACTERISATION EN LIGNE DE DIODES LASER
Abstract
(EN)
A method of collecting data points of operating modes of a tunable laser for recharacterization of the laser while installed in an application. Operation of the laser is stopped for selected time slots (12), during which data is acquired about the modes of the laser, similar to that acquired during conventional characterization of the laser. These time slots (12) are spaced over time (10) in such a way that do not significantly affect normal operation of the application. After enough measurements have been acquired, new working points are calculated using a known algorithm for laser characterization. The laser control tables of operating currents to the various sections of the laser are then updated for these new working points. The method ensures that a recharacterization cycle is completed in significantly less time than the typical time scale of the aging phenomena, such that the recharacterization process closely tracks the aging process in small steps.
(FR)
L'invention concerne un procédé permettant de collecter des points de données de modes opératoires d'un laser syntonisable afin de le caractériser à nouveau lorsqu'on l'installe dans une application. Le fonctionnement du laser est arrêté pendant des fentes temporelles sélectionnées au cours desquelles des données concernant les modes du laser sont acquises, ces données étant identiques à celles acquises pendant une caractérisation de laser classique. Ces fentes temporelles sont espacées dans le temps de sorte qu'elles n'affectent pas significativement le fonctionnement normal de l'application. Une fois qu'on a acquis suffisamment de mesures, on calcule de nouveaux points de travail à l'aide d'un algorithme de caractérisation de laser connu. Puis, on met à jour des tables de commande laser de courants de fonctionnement alimentant des sections variées de laser pour ces nouveaux points de travail. Ce procédé permet d'assurer l'exécution d'un cycle de caractérisation nouvelle en un temps significativement inférieur à l'échelle temporelle générale du phénomène de vieillissement, de sorte que ledit procédé suit étroitement le procédé de vieillissement en petits étapes.
Also published as
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