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1. (WO2003065443) PROBE STATION
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2003/065443 International Application No.: PCT/US2002/038960
Publication Date: 07.08.2003 International Filing Date: 04.12.2002
Chapter 2 Demand Filed: 29.09.2003
IPC:
G01R 31/28 (2006.01)
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28
Testing of electronic circuits, e.g. by signal tracer
Applicants:
CASCADE MICROTECH, INC. [US/US]; 2430 NW 206th Avenue Beaverton, OR 97006, US (AllExceptUS)
NAVRATIL, Peter [US/US]; US (UsOnly)
FROEMKE, Brad [US/US]; US (UsOnly)
STEWART, Craig [GB/GB]; GB (UsOnly)
LORD, Anthony [GB/GB]; GB (UsOnly)
SPENCER, Jeff [US/US]; US (UsOnly)
RUMBAUGH, Scott [US/US]; US (UsOnly)
FISHER, Gavin [GB/GB]; GB (UsOnly)
MC CANN, Pete [US/US]; US (UsOnly)
JONES, Rod [US/US]; US (UsOnly)
Inventors:
NAVRATIL, Peter; US
FROEMKE, Brad; US
STEWART, Craig; GB
LORD, Anthony; GB
SPENCER, Jeff; US
RUMBAUGH, Scott; US
FISHER, Gavin; GB
MC CANN, Pete; US
JONES, Rod; US
Agent:
RUSSELL, Kevin, L.; 1600 ODS Tower 601 SW Second Avenue Portland, OR 97204, US
Priority Data:
10/285,13530.10.2002US
60/351,84425.01.2002US
Title (EN) PROBE STATION
(FR) STATION DE SONDAGE
Abstract:
(EN) The probe station (10) includes the chuck (12) that supports the electrical device (14) to be probed by the probe apparatus (16) that extends through an opening in the platen (18), an outer shield box (24) provides sufficient space for the chuck (12) to be moved laterally by positioner (22), because the chuck (12) may freely move within the outer shield box (24), a suspended member (26) electrically interconnected to a guard potential may readily position above the chuck (12).
(FR) Cette invention concerne une station de sondage.
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Designated States: AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DZ, EC, EE, ES, FI, GB, GD, GE, GH, GM, HR, HU, ID, IL, IN, IS, JP, KE, KG, KP, KR, KZ, LC, LK, LR, LS, LT, LU, LV, MA, MD, MG, MK, MN, MW, MX, MZ, NO, NZ, OM, PH, PL, PT, RO, RU, SD, SE, SG, SK, SL, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VN, YU, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (GH, GM, KE, LS, MW, MZ, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, IE, IT, LU, MC, NL, PT, SE, SI, SK, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)