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1. (WO2003063207) CONTEXT-SENSITIVE CONSTRAINT DRIVEN UNIQUIFICATION AND CHARACTERIZATION OF STANDARD CELLS
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2003/063207    International Application No.:    PCT/US2003/002036
Publication Date: 31.07.2003 International Filing Date: 23.01.2003
Chapter 2 Demand Filed:    18.08.2003    
IPC:
G06F 17/50 (2006.01)
Applicants: ZENASIS TECHNOLOGIES, INC. [US/US]; 1671 Dell Avenue, Suite 203, Campbell, CA 95008 (US)
Inventors: BHATTACHARYA, Debashis; (US).
VAMSI, Boppana; (US)
Agent: GREEFLEY, Paul, D.; Ohlandt, Greeley, Ruggiero & Perle, L.L.P., 1 Landmark Square, 10th Floor, Stamford, CT 06901-2682 (US)
Priority Data:
10/056,343 24.01.2002 US
Title (EN) CONTEXT-SENSITIVE CONSTRAINT DRIVEN UNIQUIFICATION AND CHARACTERIZATION OF STANDARD CELLS
(FR) CARACTERISATION ET MISE SOUS FORME UNIQUE SOUS CONTRAINTE SENSIBLE AU CONTEXTE DE CELLULES STANDARDS
Abstract: front page image
(EN)The present invention relates to a method for minimizing the number of standard cells required to implement a digital circuit and for improving the characterization of new standard cells based on their context/environment (605, 705). In addition, a systematic method that utilizes detailed characterization at the transistor-level on critical areas of the design for improved characterization and optimization of the entire design (425, 500) is presented.
(FR)L'invention concerne un procédé de minimisation du nombre de cellules standards, nécessaires à la mise en oeuvre d'un circuit numérique, et d'amélioration de la caractérisation des nouvelles cellules standards reposant sur leur contexte/environnement. Elle concerne aussi un procédé systématique utilisant une caractérisation détaillée, au niveau transistor, des zones critiques du concept afin d'améliorer la caractérisation et l'optimisation du concept complet.
Designated States: AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DZ, EC, EE, ES, FI, GB, GD, GE, GH, GM, HR, HU, ID, IL, IN, IS, JP, KE, KG, KP, KR, KZ, LC, LK, LR, LS, LT, LU, LV, MA, MD, MG, MK, MN, MW, MX, MZ, NO, NZ, OM, PH, PL, PT, RO, RU, SC, SD, SE, SG, SK, SL, TJ, TM, TN, TR, TT, TZ, UA, UG, UZ, VC, VN, YU, ZA, ZM, ZW.
African Regional Intellectual Property Organization (GH, GM, KE, LS, MW, MZ, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IT, LU, MC, NL, PT, SE, SI, SK, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)