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Pub. No.:    WO/2002/033959    International Application No.:    PCT/IB2001/002716
Publication Date: 25.04.2002 International Filing Date: 17.10.2001
G06T 7/00 (2006.01), H04N 5/335 (2011.01)
Applicants: ASTI HOLDINGS LIMITED [SG/SG]; Block 25 Kallang Avenue #03-01/04, Singapore 339416 (SG) (For All Designated States Except US).
SREENIVAS, Rao [IN/IN]; (IN) (For US Only).
NOOR, Ashedah, Binti, Jusoh [MY/SG]; (SG) (For US Only)
Inventors: SREENIVAS, Rao; (IN).
NOOR, Ashedah, Binti, Jusoh; (SG)
Agent: ROURK, Christopher J.; Akin, Gump, Strauss, Hauer & Feld, L.L.P., 1700 Pacific Avenue, Suite 4100, Dallas, TX 75201-4675 (US)
Priority Data:
09/693,323 20.10.2000 US
Abstract: front page image
(EN)A system for inspecting components is provided. The system includes a CMOS imaging system generating image data, such as pixel data from a pixel array. An image analysis system is connected to the CMOS imaging system, the image analysis system receiving the image data and generating image analysis data. The CMOS imaging system generates the image data at a rate that allows the CMOS imaging device to be used for inspecting components.
(FR)L'invention concerne un système pour contrôler les composants. Ce système comprend un système d'imagerie CMOS générant des données d'images, comme des données de pixels à partir d'un ensemble de pixels. Un système d'analyse d'images est connecté au système d'imagerie CMOS, ce système d'analyse d'images recevant les données d'images et générant des données d'analyse d'images. Ce système d'imagerie CMOS génère les données d'images selon un taux qui permet au dispositif d'imagerie CMOS d'être utilisé pour contrôler les composants.
Designated States: AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DZ, EC, EE, ES, FI, GB, GD, GE, GH, GM, HR, HU, ID, IL, IN, IS, JP, KE, KG, KP, KR, KZ, LC, LK, LR, LS, LT, LU, LV, MA, MD, MG, MK, MN, MW, MX, MZ, NO, NZ, PH, PL, PT, RO, RU, SD, SE, SG, SI, SK, SL, TJ, TM, TR, TT, TZ, UA, UG, US, UZ, VN, YU, ZA, ZW.
African Regional Intellectual Property Organization (GH, GM, KE, LS, MW, MZ, SD, SL, SZ, TZ, UG, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LU, MC, NL, PT, SE, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)