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Machine translation
1. (WO2002027335) A METHOD AND AN APPARATUS FOR TESTING ELECTRONIC DEVICES
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2002/027335    International Application No.:    PCT/US2001/030364
Publication Date: 04.04.2002 International Filing Date: 26.09.2001
Chapter 2 Demand Filed:    25.04.2002    
IPC:
G01R 1/073 (2006.01)
Applicants: INTEL CORPORATION [US/US]; 2200 Mission College Boulevard, Santa Clara, CA 95052 (US)
Inventors: FONG, Tark, Wooi; (MY).
LIM, Chu, Aun; (MY).
CHAN, Kok, Hong; (MY)
Agent: MALLIE, Michael, J.; Blakely, Sokoloff, Taylor & Zafman, 7th floor, 12400 Wilshire Boulevard, Los Angeles, CA 90025 (US)
Priority Data:
09/675,802 29.09.2000 US
Title (EN) A METHOD AND AN APPARATUS FOR TESTING ELECTRONIC DEVICES
(FR) PROCEDE ET APPAREIL PERMETTANT DE TESTER DES DISPOSITIFS ELECTRONIQUES
Abstract: front page image
(EN)An apparatus comprising a body having a first signal line through a first plane of the body and a second signal line through a second plane of the body. A first set of contact elements extend through the body and are coupled to the first signal line. A second set of contact elements extend through the body and are coupled to the second signal lines. The first set of contact elements and the second set of contact elements correspond to a portion of external contact points of an integrated circuit.
(FR)L'invention concerne un appareil comportant un corps doté d'une première ligne de signaux traversant un premier plan du corps et une seconde ligne de signaux traversant un second plan du corps. Un premier ensemble d'éléments de contact traversent le corps et sont couplés à la première ligne de signaux. Un second ensemble d'éléments de contact traversent le corps et sont couplés à la seconde ligne de signaux. Le premier et le second ensemble d'éléments de contact correspondent à une partie de points de contact extérieurs d'un circuit intégré.
Designated States: AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DZ, EC, EE, ES, FI, GB, GD, GE, GH, GM, HR, HU, ID, IL, IN, IS, JP, KE, KG, KP, KR, KZ, LC, LK, LR, LS, LT, LU, LV, MA, MD, MG, MK, MN, MW, MX, MZ, NO, NZ, PH, PL, PT, RO, RU, SD, SE, SG, SI, SK, SL, TJ, TM, TR, TT, TZ, UA, UG, UZ, VN, YU, ZA, ZW.
African Regional Intellectual Property Organization (GH, GM, KE, LS, MW, MZ, SD, SL, SZ, TZ, UG, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LU, MC, NL, PT, SE, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)