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1. WO2002025265 - PROBING METHOD USING ION TRAP MASS SPECTROMETER AND PROBING DEVICE

Publication Number WO/2002/025265
Publication Date 28.03.2002
International Application No. PCT/JP2000/006411
International Filing Date 20.09.2000
Chapter 2 Demand Filed 18.12.2000
IPC
H01J 49/42 2006.1
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
26Mass spectrometers or separator tubes
34Dynamic spectrometers
42Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
CPC
G01N 33/0057
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
33Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
0004Gaseous mixtures, e.g. polluted air
0009General constructional details of gas analysers, e.g. portable test equipment
0027concerning the detector
0036Specially adapted to detect a particular component
0057for warfare agents or explosives
H01J 49/0031
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
0027Methods for using particle spectrometers
0031Step by step routines describing the use of the apparatus
H01J 49/004
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
004Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
H01J 49/424
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
26Mass spectrometers or separator tubes
34Dynamic spectrometers
42Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
4205Device types
424Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
Applicants
  • HITACHI, LTD. [JP]/[JP] (AllExceptUS)
  • TAKADA, Yasuaki [JP]/[JP] (UsOnly)
  • SAKAIRI, Minoru [JP]/[JP] (UsOnly)
Inventors
  • TAKADA, Yasuaki
  • SAKAIRI, Minoru
Agents
  • SAKUTA, Yasuo
Priority Data
Publication Language Japanese (JA)
Filing Language Japanese (JA)
Designated States
Title
(EN) PROBING METHOD USING ION TRAP MASS SPECTROMETER AND PROBING DEVICE
(FR) PROCEDE DE SONDAGE FAISANT INTERVENIR UN SPECTROMETRE DE MASSE A PIEGE IONIQUE ET DISPOSITIF DE SONDAGE
Abstract
(EN)
A probing device based on mass spectrometry, wherein a fast screening is conducted by using a step (201) of acquiring mass spectrum and a step (202) of judging whether or not an intrinsic m/z ion exists. Switching is made, for scrutinizing, to a step (203) of conducting a tandem mass spectrometry depending on the judged result in the judging step (202). A warning is triggered (205) from the result obtained in the tandem mass spectrometry via a step (204) of judging whether or not an intrinsic m/z ion exists and according to the judgment result. Whereby, a fast and substantially error-free probing is made possible.
(FR)
L'invention concerne un dispositif de sondage basé sur la spectrométrie de masse. Un criblage rapide est effectué au moyen d'une étape (201) consistant à acquérir un spectre de masse et d'une étape (202) consistant à déterminer si un ion à m/z intrinsèque existe ou non. A des fins de vérification, on passe à une étape (203) qui consiste à réaliser une spectrométrie de masse en tandem en fonction du résultat de l'étape (202). Un avertissement est déclenché (205) à partir du résultat obtenu dans la spectrométrie de masse en tandem via une étape (204) consistant à déterminer si un ion à m/z intrinsèque existe ou non et en fonction du résultat de la détermination. On peut ainsi effectuer un sondage rapide et sensiblement dépourvu d'erreur.
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