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1. WO2002018966 - DIGITIZER AND SEMICONDUCTOR TEST INSTRUMENT

Publication Number WO/2002/018966
Publication Date 07.03.2002
International Application No. PCT/JP2001/007466
International Filing Date 30.08.2001
Chapter 2 Demand Filed 04.03.2002
IPC
G01R 31/3167 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
3167Testing of combined analog and digital circuits
H03M 1/06 2006.01
HELECTRICITY
03BASIC ELECTRONIC CIRCUITRY
MCODING, DECODING OR CODE CONVERSION, IN GENERAL
1Analogue/digital conversion; Digital/analogue conversion
06Continuously compensating for, or preventing, undesired influence of physical parameters
H03M 1/08 2006.01
HELECTRICITY
03BASIC ELECTRONIC CIRCUITRY
MCODING, DECODING OR CODE CONVERSION, IN GENERAL
1Analogue/digital conversion; Digital/analogue conversion
06Continuously compensating for, or preventing, undesired influence of physical parameters
08of noise
H03M 1/12 2006.01
HELECTRICITY
03BASIC ELECTRONIC CIRCUITRY
MCODING, DECODING OR CODE CONVERSION, IN GENERAL
1Analogue/digital conversion; Digital/analogue conversion
12Analogue/digital converters
CPC
G01R 31/3167
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
3167Testing of combined analog and digital circuits
H03M 1/0626
HELECTRICITY
03BASIC ELECTRONIC CIRCUITRY
MCODING; DECODING; CODE CONVERSION IN GENERAL
1Analogue/digital conversion; Digital/analogue conversion
06Continuously compensating for, or preventing, undesired influence of physical parameters
0617characterised by the use of methods or means not specific to a particular type of detrimental influence
0626by filtering
H03M 1/0836
HELECTRICITY
03BASIC ELECTRONIC CIRCUITRY
MCODING; DECODING; CODE CONVERSION IN GENERAL
1Analogue/digital conversion; Digital/analogue conversion
06Continuously compensating for, or preventing, undesired influence of physical parameters
08of noise
0836of phase error, e.g. jitter
H03M 1/1215
HELECTRICITY
03BASIC ELECTRONIC CIRCUITRY
MCODING; DECODING; CODE CONVERSION IN GENERAL
1Analogue/digital conversion; Digital/analogue conversion
12Analogue/digital converters
1205Multiplexed conversion systems
121Interleaved, i.e. using multiple converters or converter parts for one channel
1215using time-division multiplexing
Applicants
  • ADVANTEST CORPORATION [JP]/[JP] (AllExceptUS)
  • ASAMI, Koji [JP]/[JP] (UsOnly)
Inventors
  • ASAMI, Koji
Agents
  • RYUKA, Akihiro
Priority Data
2000-26027130.08.2000JP
Publication Language Japanese (JA)
Filing Language Japanese (JA)
Designated States
Title
(EN) DIGITIZER AND SEMICONDUCTOR TEST INSTRUMENT
(FR) NUMERISEUR ET INSTRUMENT DE TEST SEMICONDUCTEUR
Abstract
(EN)
An interleaving AD conversion waveform digitizer in which the digitizer comprises N AD converters (N is two or more integer) having N interleaving phases and interconnected in an interleaving structure, the sampling of each AD converter is carried out at predetermined timing corresponding to the interleaving structure, digital signals are continuously outputted, the measurement signal outputted from a device to be measured is quantized, and time-series data from the AD converters is Fourier-transformed by butterfly calculation, characterized by comprising a window function multiplying section for determining a coefficient on the basis of the phase error and a butterfly calculation section for performing butterfly calculation by inserting a phase error correction coefficient.
(FR)
L'invention concerne un numériseur de forme d'onde à conversion analogique-numérique à entrelacement, comprenant N convertisseurs analogique-numérique (N représentant au moins deux entiers relatifs) présentant N phases d'entrelacement et interconnectés dans une structure à entrelacement. L'échantillonnage de chaque convertisseur analogique-numérique est effectué selon une synchronisation prédéterminée correspondant à la structure à entrelacement, les signaux numériques sont produits en continu, le signal de mesure produit par un dispositif à mesuré est quantifié et les données chronologiques provenant des convertisseurs analogique-numérique sont soumises à la transformation de Fourier par calcul à effet papillon. Ce numériseur se caractérise en ce qu'il comprend une section de multiplication à fonction fenêtre permettant de déterminer un coefficient en fonction de l'erreur de phase et une section de calcul par effet papillon permettant de réaliser des calculs par effet papillon par introduction d'un coefficient de correction d'erreur de phase.
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